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Browsing by  AuthorKai Zhao

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Conference
Bias Temperature Instability Model for Digital Circuits – Predicting Instantaneous FET Response

IEEE International Reliability Physics Symposium (IRPS), page. 2.1 - 2.4, 2011-04-10

Conference
PBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability

Symposium on VLSI Circuits, page. 224 - 225, 2011-06-17

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