Electron trapping and extraction kinetics on carrier diffusion in metal halide perovskite thin films
SCIE
SCOPUS
- Title
- Electron trapping and extraction kinetics on carrier diffusion in metal halide perovskite thin films
- Authors
- Kang, G.; Yoon, J.-S.; Kim, G.-W.; Choi, K.; PARK, TAI HO; Baek, R.-H.; Lim, J.
- Date Issued
- 2019-12
- Publisher
- Royal Society of Chemistry
- Abstract
- Understanding initial electron distribution, diffusion, trapping and extraction processes for charge transfer
kinetics in metal halide perovskite thin films is crucial for the improvement in device performances, but it still
remains ambiguous in the research community. In particular, the kinetics of early-time carrier trapping
should be considered with that of diffusion because these processes competitively occur in the same
time domain. We herein presented the role of free electron trapping for the diffusion process by
employing a dynamic trapping model on time-resolved photoluminescence, the most commonly
employed technique to investigate charge transfer kinetics. The origin of the stretched exponential
decay behavior of the trapping process, which appeared in the fast component of TRPL, was
phenomenologically described and further clarified through a simulation study. We found that the
electron injection coefficient at the interface between the perovskite and the electron transport layer
was a more important determinant than the electron mobility of the perovskite in the electron extraction
process.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/100255
- DOI
- 10.1039/C9TA06254H
- ISSN
- 2050-7488
- Article Type
- Article
- Citation
- Journal of Materials Chemistry A, vol. 7, no. 45, page. 25838 - 25844, 2019-12
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