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dc.contributor.authorLIM, GEUN BAE-
dc.contributor.authorKIM, KANGHYUN-
dc.contributor.author박병규-
dc.contributor.author오현택-
dc.contributor.author이진균-
dc.contributor.author이상설-
dc.date.accessioned2020-01-03T06:52:48Z-
dc.date.available2020-01-03T06:52:48Z-
dc.date.created2019-12-17-
dc.date.issued2019-08-21-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/100615-
dc.publisher한국광학회-
dc.relation.isPartOf2019 차세대 리소그래피 학술대회-
dc.relation.isPartOf2019 차세대 리소그래피 학술대회-
dc.titlePrediction study of the theoretical contrast of extreme ultraviolet photoresist by electron beam and EUV exposure test-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2019 차세대 리소그래피 학술대회-
dc.citation.conferenceDate2019-08-21-
dc.citation.conferencePlaceKO-
dc.citation.title2019 차세대 리소그래피 학술대회-
dc.contributor.affiliatedAuthorLIM, GEUN BAE-
dc.contributor.affiliatedAuthorKIM, KANGHYUN-
dc.description.journalClass2-
dc.description.journalClass2-

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임근배LIM, GEUN BAE
Dept of Mechanical Enginrg
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