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Cited 25 time in webofscience Cited 30 time in scopus
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dc.contributor.authorSeol, SK-
dc.contributor.authorYi, JM-
dc.contributor.authorJin, X-
dc.contributor.authorKim, CC-
dc.contributor.authorJe, JH-
dc.contributor.authorTsai, WL-
dc.contributor.authorHsu, PC-
dc.contributor.authorHwu, Y-
dc.contributor.authorChen, CH-
dc.contributor.authorChang, LW-
dc.contributor.authorMargaritondo, G-
dc.date.accessioned2015-06-25T01:50:23Z-
dc.date.available2015-06-25T01:50:23Z-
dc.date.created2009-02-28-
dc.date.issued2004-01-
dc.identifier.issn1099-0062-
dc.identifier.other2015-OAK-0000004491en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10108-
dc.description.abstractLocalized electrochemical deposition (LECD) is an emerging technology for inexpensive and effective fabrication of high-aspect-ratio microstructure of diverse materials. Microradiology with coherent X-rays enabled study of this process in real-time. This led to the discovery of a fundamental role of the microelectrode-structure distance: for short distances the deposition rate increases dramatically but the product becomes porous. This role is explained qualitatively with the interplay between metal-ion diffusion and migration in the deposition process. (C) 2004 The Electrochemical Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherELECTROCHEMICAL SOC INC-
dc.relation.isPartOfELECTROCHEMICAL AND SOLID STATE LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleCoherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1149/1.1775951-
dc.author.googleSeol, SKen_US
dc.author.googleYi, JMen_US
dc.author.googleMargaritondo, Gen_US
dc.author.googleChang, LWen_US
dc.author.googleChen, CHen_US
dc.author.googleHwu, Yen_US
dc.author.googleHsu, PCen_US
dc.author.googleTsai, WLen_US
dc.author.googleJe, JHen_US
dc.author.googleKim, CCen_US
dc.author.googleJin, Xen_US
dc.relation.volume7en_US
dc.relation.issue9en_US
dc.contributor.id10123980en_US
dc.relation.journalELECTROCHEMICAL AND SOLID STATE LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.9, pp.C95 - C97-
dc.identifier.wosid000223472300012-
dc.date.tcdate2019-01-01-
dc.citation.endPageC97-
dc.citation.number9-
dc.citation.startPageC95-
dc.citation.titleELECTROCHEMICAL AND SOLID STATE LETTERS-
dc.citation.volume7-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-4944255285-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc24-
dc.description.scptc29*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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