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Cited 5 time in webofscience Cited 5 time in scopus
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dc.contributor.authorKim, WK-
dc.contributor.authorLee, JL-
dc.date.accessioned2015-06-25T01:51:18Z-
dc.date.available2015-06-25T01:51:18Z-
dc.date.created2009-07-06-
dc.date.issued2008-01-
dc.identifier.issn1099-0062-
dc.identifier.other2015-OAK-0000016890en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10123-
dc.description.abstractWe report the influence of UV irradiation on the electrical properties of pentacene thin-film transistors (TFTs) with SiO2 gate insulator. The threshold voltage (V-th) shifted from - 9.0 to - 5.1 V and subthreshold slope reduced from 3.6 to 1.1 V/dec by the treatment before pentacene deposition. The UV treatment reduced the surface energy by removing the hydroxyl groups at the SiO2 surface. Thus, molecular packing of pentacene on the UV-treated SiO2 was improved, lowering the |V-th| value via the reduction of trap densities in the channel region. The decrease in interface state density reduced the subthreshold slope. (C) 2007 The Electrochemical Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherELECTROCHEMICAL SOC INC-
dc.relation.isPartOfELECTROCHEMICAL AND SOLID STATE LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleEffect of UV irradiation on threshold voltage and subthreshold slope in pentacene TFT-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1149/1.2795841-
dc.author.googleKIM, WKen_US
dc.author.googleLEE, JLen_US
dc.relation.volume11en_US
dc.relation.issue1en_US
dc.relation.startpageH4en_US
dc.relation.lastpageH6en_US
dc.contributor.id10105416en_US
dc.relation.journalELECTROCHEMICAL AND SOLID STATE LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTROCHEMICAL AND SOLID STATE LETTERS, v.11, no.1, pp.H4 - H6-
dc.identifier.wosid000250983500016-
dc.date.tcdate2019-01-01-
dc.citation.endPageH6-
dc.citation.number1-
dc.citation.startPageH4-
dc.citation.titleELECTROCHEMICAL AND SOLID STATE LETTERS-
dc.citation.volume11-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-36248959365-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.description.scptc5*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusFIELD-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusINTERFACE-
dc.subject.keywordPlusSIO2-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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