Full metadata record
DC Field | Value | Language |
dc.contributor.author | KIM, KWANG JAE | - |
dc.contributor.author | CHOI, SEUNG HYUN | - |
dc.contributor.author | LEE, CHANG HO | - |
dc.contributor.author | LEE, DONG HEE | - |
dc.date.accessioned | 2020-04-06T04:50:20Z | - |
dc.date.available | 2020-04-06T04:50:20Z | - |
dc.date.created | 2020-04-05 | - |
dc.date.issued | 2019-12-04 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/102424 | - |
dc.publisher | APIEMS | - |
dc.relation.isPartOf | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
dc.relation.isPartOf | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
dc.title | Development of a Wafer Bin Map Defect Pattern Classification Scheme: Spatial Element-based Approach | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
dc.citation.conferenceDate | 2019-12-02 | - |
dc.citation.conferencePlace | JA | - |
dc.citation.title | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
dc.contributor.affiliatedAuthor | KIM, KWANG JAE | - |
dc.contributor.affiliatedAuthor | CHOI, SEUNG HYUN | - |
dc.contributor.affiliatedAuthor | LEE, CHANG HO | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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