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dc.contributor.authorHONG, WONBIN-
dc.contributor.authorJUNG, SOHYEON-
dc.contributor.authorCHOO, MOOGOONG-
dc.contributor.authorLEE, JAEYEONG-
dc.contributor.authorAHN, INSUNG-
dc.contributor.authorKangseop Lee-
dc.date.accessioned2020-04-08T05:06:14Z-
dc.date.available2020-04-08T05:06:14Z-
dc.date.created2020-04-07-
dc.date.issued2019-05-19-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/102796-
dc.publisherIEEE-
dc.relation.isPartOf2019 IEEE MTT-S International Wireless Symposium (IWS)-
dc.relation.isPartOf2019 IEEE MTT-S International Wireless Symposium (IWS)-
dc.titleFree-Space Permittivity Measurement for Inhomogeneous PSV-Coated Si-wafer at Frequencies from 75 GHz to 325 GHz-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2019 IEEE MTT-S International Wireless Symposium (IWS)-
dc.citation.conferenceDate2019-05-19-
dc.citation.conferencePlaceCC-
dc.citation.title2019 IEEE MTT-S International Wireless Symposium (IWS)-
dc.contributor.affiliatedAuthorHONG, WONBIN-
dc.contributor.affiliatedAuthorJUNG, SOHYEON-
dc.contributor.affiliatedAuthorCHOO, MOOGOONG-
dc.contributor.affiliatedAuthorLEE, JAEYEONG-
dc.contributor.affiliatedAuthorAHN, INSUNG-
dc.contributor.affiliatedAuthorKangseop Lee-
dc.description.journalClass1-
dc.description.journalClass1-

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홍원빈HONG, WONBIN
Dept of Electrical Enginrg
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