Full metadata record
DC Field | Value | Language |
dc.contributor.author | KANG, BONG KOO | - |
dc.contributor.author | Hyeokjin Kim | - |
dc.contributor.author | Gi-Youn Roh | - |
dc.date.accessioned | 2020-04-17T01:51:08Z | - |
dc.date.available | 2020-04-17T01:51:08Z | - |
dc.date.created | 2020-04-16 | - |
dc.date.issued | 2019-11-19 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103481 | - |
dc.publisher | IWDTF 2019 | - |
dc.relation.isPartOf | IWDTF 2019 | - |
dc.relation.isPartOf | JJAP | - |
dc.title | Characterization of fast relaxation by oxide-trapped charges under BTI stress on 64-nm HfSiON/SiO2 MOFSETs | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | IWDTF 2019 | - |
dc.citation.conferenceDate | 2019-11-18 | - |
dc.citation.conferencePlace | JA | - |
dc.citation.title | IWDTF 2019 | - |
dc.contributor.affiliatedAuthor | KANG, BONG KOO | - |
dc.contributor.affiliatedAuthor | Hyeokjin Kim | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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