DEPENDENCE OF THE MAGNETIC-PROPERTIES OF CO/PD MULTILAYERED FILMS ON THE STRUCTURAL PARAMETERS ESTIMATED ACCURATELY BY X-RAY-DIFFRACTION
SCIE
SCOPUS
- Title
- DEPENDENCE OF THE MAGNETIC-PROPERTIES OF CO/PD MULTILAYERED FILMS ON THE STRUCTURAL PARAMETERS ESTIMATED ACCURATELY BY X-RAY-DIFFRACTION
- Authors
- HONG, JH; JEONG, JI; KANG, JS; KIM, SK; KOO, YM; LEE, YP; SHIN, HJ
- Date Issued
- 1992-11-15
- Publisher
- AMER INST PHYSICS
- Abstract
- In this study, Co/Pd multilayered films with a few atomic layers of Co were prepared by alternating deposition in an ultrahigh-vacuum physical-vapor-deposition system. The structural parameters were estimated accurately making use of only the angular positions of x-ray diffraction peaks. The magnetic properties were found to vary greatly depending on Pd predeposition and Pd-sublayer thicknesses as well as Co-sublayer thickness. The Pd-predeposited films were found to have a remarkably high coercivity of 4723 Oe and a greatly enhanced interfacial magnetic anisotropy of 0.72 mJ/m2, which indicates an excellent potential as a magneto-optical recording medium.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10447
- DOI
- 10.1063/1.352021
- ISSN
- 0021-8979
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED PHYSICS, vol. 72, no. 10, page. 4986 - 4989, 1992-11-15
- Files in This Item:
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