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Cited 33 time in webofscience Cited 37 time in scopus
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dc.contributor.authorHan, YS-
dc.contributor.authorSong, JH-
dc.contributor.authorHeo, J-
dc.date.accessioned2015-06-25T02:12:33Z-
dc.date.available2015-06-25T02:12:33Z-
dc.date.created2009-02-28-
dc.date.issued2003-09-01-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000003617en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10527-
dc.description.abstractMechanisms of cross relaxation (H-3(4), H-3(6)-->F-3(4), F-3(4)) in Tm3+-doped PbO-Bi2O3-Ga2O3-GeO2 glass were analyzed. The energy gap between the absorption (H-3(6)-->F-3(4)) and emission (H-3(4)-->F-3(4)) spectra was approximately 600 cm(-1). A large decrease in cross relaxation rates at low temperatures indicated that cross relaxation is controlled by a phonon-assisted energy transfer. The bending vibration of the Ga-O-Ga bonds between GaO4 tetrahedra (similar to550 cm(-1)) was directly responsible for this energy transfer. Although GeO2 was added to enhance the thermal stability of PbO-Bi2O3-Ga2O3 glass, the phonon mode associated with vibration of GeO2 (similar to770 cm(-1)) was not involved in the cross relaxation process. (C) 2003 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF APPLIED PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleAnalysis of cross relaxation between Tm3+ ions in PbO-Bi2O3-Ga2O3-GeO2 glass-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.1595148-
dc.author.googleHan, YSen_US
dc.author.googleSong, JHen_US
dc.author.googleHeo, Jen_US
dc.relation.volume94en_US
dc.relation.issue5en_US
dc.relation.startpage2817en_US
dc.relation.lastpage2820en_US
dc.contributor.id10054646en_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.94, no.5, pp.2817 - 2820-
dc.identifier.wosid000184844200003-
dc.date.tcdate2019-01-01-
dc.citation.endPage2820-
dc.citation.number5-
dc.citation.startPage2817-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume94-
dc.contributor.affiliatedAuthorHeo, J-
dc.identifier.scopusid2-s2.0-0141633963-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc30-
dc.description.scptc34*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusMETAL OXIDE GLASSES-
dc.subject.keywordPlusMU-M EMISSION-
dc.subject.keywordPlusMULTIPHONON RELAXATION-
dc.subject.keywordPlusRAMAN-
dc.subject.keywordPlusMECHANISM-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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허종HEO, JONG
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