DC Field | Value | Language |
---|---|---|
dc.contributor.author | YOON, GIL SANG | - |
dc.contributor.author | GO, DONG HYUN | - |
dc.contributor.author | JIN, JAE SEOK | - |
dc.contributor.author | PARK, JOUNG HUN | - |
dc.contributor.author | LEE, JEONG SOO | - |
dc.date.accessioned | 2021-06-01T02:35:37Z | - |
dc.date.available | 2021-06-01T02:35:37Z | - |
dc.date.created | 2021-03-11 | - |
dc.date.issued | 2021-02 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/105308 | - |
dc.language | English | - |
dc.publisher | ICEIC | - |
dc.relation.isPartOf | 2021 International Conference on Electronics, Information, and Communication | - |
dc.title | Impact of P/E cycling stress on trap distributions in tunneling and blocking layers for 3-D VNAND flash memory applications | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2021 International Conference on Electronics, Information, and Communication | - |
dc.citation.conferenceDate | 2021-01-31 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 2021 International Conference on Electronics, Information, and Communication | - |
dc.contributor.affiliatedAuthor | YOON, GIL SANG | - |
dc.contributor.affiliatedAuthor | GO, DONG HYUN | - |
dc.contributor.affiliatedAuthor | JIN, JAE SEOK | - |
dc.contributor.affiliatedAuthor | PARK, JOUNG HUN | - |
dc.contributor.affiliatedAuthor | LEE, JEONG SOO | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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