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Cited 115 time in webofscience Cited 126 time in scopus
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dc.contributor.authorLee, KH-
dc.contributor.authorJang, HW-
dc.contributor.authorKim, KB-
dc.contributor.authorTak, YH-
dc.contributor.authorLee, JL-
dc.date.accessioned2015-06-25T02:13:28Z-
dc.date.available2015-06-25T02:13:28Z-
dc.date.created2009-02-28-
dc.date.issued2004-01-15-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000003912en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10551-
dc.description.abstractThe effects of O-2 inductively coupled plasma (ICP) treatment on the chemical composition and work function of indium-tin-oxide (ITO) surface were investigated. Synchrotron radiation photoemission spectroscopy showed that the O-2 ICP treatment resulted in the increase of the ITO work function by 0.8 eV. Incorporation of oxygen atoms near the ITO surface during the ICP treatment induced a peroxidic ITO surface, increasing the work function. The enhanced oxidation of a thin Ni overlayer on the O-2-ICP-treated sample suggests that preventing the migration of oxygen atoms into the active region of organic light-emitting diodes is important for improving device lifetime. (C) 2004 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF APPLIED PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleMechanism for the increase of indium-tin-oxide work function by O-2 inductively coupled plasma treatment-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.1633351-
dc.author.googleLee, KHen_US
dc.author.googleJang, HWen_US
dc.author.googleLee, JLen_US
dc.author.googleTak, YHen_US
dc.author.googleKim, KBen_US
dc.relation.volume95en_US
dc.relation.issue2en_US
dc.relation.startpage586en_US
dc.relation.lastpage590en_US
dc.contributor.id10105416en_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.95, no.2, pp.586 - 590-
dc.identifier.wosid000187659600027-
dc.date.tcdate2019-01-01-
dc.citation.endPage590-
dc.citation.number2-
dc.citation.startPage586-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume95-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-0742303031-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc97-
dc.description.scptc104*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusLIGHT-EMITTING-DIODES-
dc.subject.keywordPlusPHOTOELECTRON-SPECTROSCOPY-
dc.subject.keywordPlusELECTROLUMINESCENT DEVICES-
dc.subject.keywordPlusHOLE INJECTION-
dc.subject.keywordPlusBARRIER-
dc.subject.keywordPlusLAYER-
dc.subject.keywordPlusGAN-
dc.subject.keywordPlusULTRAVIOLET-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordPlusOXIDATION-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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