DC Field | Value | Language |
---|---|---|
dc.contributor.author | Weon, BM | - |
dc.contributor.author | Je, JH | - |
dc.date.accessioned | 2015-06-25T02:14:05Z | - |
dc.date.available | 2015-06-25T02:14:05Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2005-02-01 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.other | 2015-OAK-0000004837 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/10571 | - |
dc.description.abstract | We studied mathematical models for degradation behaviors of current and voltage in electron guns especially using oxide cathodes. We found that the current and the voltage, I(t) and V(t), follow the stretched exponential decay in oxide cathodes. On this basis, we derived a general expression for the time-dependent current-voltage relation as I(t)=p(t)V(t)(delta(t)), where delta(t) is a time-dependent exponent and the perveance, p(t), is a function of delta(t). The exponent delta(t) indicates the deviation of the classical Child-Langmuir relation (I=pV(3/2)). This deviation is attributed to the gradual change of the electron gun geometry over time. (C) 2005 American Institute of Physics. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.relation.isPartOf | JOURNAL OF APPLIED PHYSICS | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Time-dependent current-voltage relation in electron guns | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | en_US |
dc.identifier.doi | 10.1063/1.1846938 | - |
dc.author.google | Weon, BM | en_US |
dc.author.google | Je, JH | en_US |
dc.relation.volume | 97 | en_US |
dc.relation.issue | 3 | en_US |
dc.contributor.id | 10123980 | en_US |
dc.relation.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF APPLIED PHYSICS, v.97, no.3 | - |
dc.identifier.wosid | 000226778300098 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 3 | - |
dc.citation.title | JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 97 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-13644282490 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 5 | - |
dc.description.scptc | 6 | * |
dc.date.scptcdate | 2018-10-274 | * |
dc.type.docType | Article | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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