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Cited 17 time in webofscience Cited 16 time in scopus
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dc.contributor.authorJin, B-
dc.contributor.authorDaegun Kang-
dc.contributor.authorJungsik Kim-
dc.contributor.authorMeyya Meyyappan-
dc.contributor.authorJeong-Soo Lee-
dc.date.accessioned2015-06-25T02:16:43Z-
dc.date.available2015-06-25T02:16:43Z-
dc.date.created2013-05-30-
dc.date.issued2013-04-28-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000027613en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10656-
dc.description.abstractThe electrical characteristics of nonvolatile In2Se3 nanowire phase change memory are reported. Size-dependent memory switching behavior was observed in nanowires of varying diameters and the reduction in set/reset threshold voltage was as low as 3.45 V/6.25V for a 60 nm nanowire, which is promising for highly scalable nanowire memory applications. Also, size-dependent thermal resistance of In2Se3 nanowire memory cells was estimated with values as high as 5.86 x 10(13) and 1.04 x 10(6) K/W for a 60 nm nanowire memory cell in amorphous and crystalline phases, respectively. Such high thermal resistances are beneficial for improvement of thermal efficiency and thus reduction in programming power consumption based on Fourier's law. The evaluation of thermal resistance provides an avenue to develop thermally efficient memory cell architecture. (C) 2013 AIP Publishing LLC-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAIP Publishing-
dc.relation.isPartOfJournal of Applied Physics-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleThermally efficient and highly scalable In2Se3 nanowire phase change memory-
dc.typeArticle-
dc.contributor.college정보전자융합공학부en_US
dc.identifier.doi10.1063/1.4802672-
dc.author.googleJin B., Kang D., Kim J., Meyyappan M., Lee J.-S.en_US
dc.relation.volume113en_US
dc.relation.issue16en_US
dc.relation.startpage164303-1en_US
dc.relation.lastpage164303-6en_US
dc.contributor.id10084860en_US
dc.relation.journalJournal of Applied Physicsen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJournal of Applied Physics, v.113, no.16, pp.164303-1 - 164303-6-
dc.identifier.wosid000318550300053-
dc.date.tcdate2019-01-01-
dc.citation.endPage164303-6-
dc.citation.number16-
dc.citation.startPage164303-1-
dc.citation.titleJournal of Applied Physics-
dc.citation.volume113-
dc.contributor.affiliatedAuthorJin, B-
dc.contributor.affiliatedAuthorMeyya Meyyappan-
dc.contributor.affiliatedAuthorJeong-Soo Lee-
dc.identifier.scopusid2-s2.0-84877304186-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc10-
dc.description.scptc8*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusMELTING TEMPERATURE-
dc.subject.keywordPlusCELL-
dc.subject.keywordPlusCONDUCTIVITY-
dc.subject.keywordPlusTECHNOLOGY-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusGE-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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