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Cited 13 time in webofscience Cited 16 time in scopus
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dc.contributor.authorJO, Ha-Nui-
dc.contributor.authorPARK, BYEONG EON-
dc.contributor.authorJI, YUMI-
dc.contributor.authorKIM, Dong-Kuk-
dc.contributor.authorYANG, Jeong Eun-
dc.contributor.authorLEE, IN BEUM-
dc.date.accessioned2021-12-03T08:43:27Z-
dc.date.available2021-12-03T08:43:27Z-
dc.date.created2020-03-17-
dc.date.issued2020-12-
dc.identifier.issn1551-3203-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/107813-
dc.description.abstractIn this article, we propose a framework to monitor the chatter phenomenon and to diagnose the cause variables of chatter occurred in the hot strip mill process (HSMP). For monitoring chatter, we develop a chatter index (CI) that quantifies chatter to confirm its occurrence. Based on the data classified as normal by the CI, a multivariate statistical process monitoring model for detecting chatter is constructed using the modified independent component analysis (MICA) method. The monitoring results show that the model based on the MICA outperforms other models based on the principal component analysis and independent component analysis. For the diagnosis of the cause variables of detected chatter, various contribution plots can be used. In this article, we develop a relative contribution plot for a more obvious diagnosis than the existing contribution plot. Using this, we diagnose and analyze the cause variables of the detected chatter in the HSMP.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS-
dc.subjectFAULT-DETECTION-
dc.titleChatter Detection and Diagnosis in Hot Strip Mill Process With a Frequency-Based Chatter Index and Modified Independent Component Analysis-
dc.typeArticle-
dc.identifier.doi10.1109/TII.2020.2978526-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.16, no.12, pp.7812 - 7820-
dc.identifier.wosid000572631900056-
dc.citation.endPage7820-
dc.citation.number12-
dc.citation.startPage7812-
dc.citation.titleIEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS-
dc.citation.volume16-
dc.contributor.affiliatedAuthorJO, Ha-Nui-
dc.contributor.affiliatedAuthorPARK, BYEONG EON-
dc.contributor.affiliatedAuthorJI, YUMI-
dc.contributor.affiliatedAuthorLEE, IN BEUM-
dc.identifier.scopusid2-s2.0-85092080755-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.type.docTypeArticle-
dc.subject.keywordAuthorMonitoring-
dc.subject.keywordAuthorIntegrated circuits-
dc.subject.keywordAuthorPrincipal component analysis-
dc.subject.keywordAuthorSteel-
dc.subject.keywordAuthorSlabs-
dc.subject.keywordAuthorCovariance matrices-
dc.subject.keywordAuthorStrips-
dc.subject.keywordAuthorChatter phenomenon-
dc.subject.keywordAuthorcontribution plot-
dc.subject.keywordAuthordata-driven fault detection-
dc.subject.keywordAuthorhot strip mill process (HSMP)-
dc.subject.keywordAuthormodified independent component analysis (MICA)-
dc.subject.keywordAuthormultivariate statistical process monitoring-
dc.relation.journalWebOfScienceCategoryAutomation & Control Systems-
dc.relation.journalWebOfScienceCategoryComputer Science, Interdisciplinary Applications-
dc.relation.journalWebOfScienceCategoryEngineering, Industrial-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaAutomation & Control Systems-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-

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