Radiation Size and Divergence at the Hard X-ray Beamline in the PAL-XFEL
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- Title
- Radiation Size and Divergence at the Hard X-ray Beamline in the PAL-XFEL
- Authors
- Parc, YW; Han, JH; Kang, HS; Kim, I; Yang, H; Hwang, I; Shim, CH; Ko, IS
- Date Issued
- 2014-04
- Publisher
- KOREAN PHYSICAL SOC
- Abstract
- In the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL), recently, the minimum gap of the hard X-ray undulator were changed from 7.2 (undulator period: 24.4 mm) to 8.3 mm (undulator period: 26 mm). To review the physical issues related to the gap change, including the radiation size and divergence, in the PAL-XFEL, we did a simulation study with GENESIS 1.3. The saturation length in the 8.3-mm case will be increased by 10% with respect to the 7.2-mm case. The study also revealed that the divergence of the radiation in 8.3-mm case would be decreased by 4% compared with that in the 7.2-mm case. In this paper, we will present the detailed simulation results to estimate the divergence of radiation at the hard X-ray beamline in the PAL-XFEL.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/107987
- DOI
- 10.3938/JKPS.64.976
- ISSN
- 0374-4884
- Article Type
- Article
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 64, no. 7, page. 976 - 981, 2014-04
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