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dc.contributor.authorLee, Seunggyu-
dc.contributor.authorYoon, Jongho-
dc.contributor.authorLee, Jakang-
dc.contributor.authorKang, Seokhyeong-
dc.date.accessioned2022-03-02T00:22:45Z-
dc.date.available2022-03-02T00:22:45Z-
dc.date.created2022-02-20-
dc.date.issued2021-10-08-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/109680-
dc.description.abstractWe propose a data acquisition system that enables over-sampling of signals with an external high-speed clock, to overcome the unreliability of the existing data acquisition method that uses a DRAM memory clock, when applied to data rate fifth-generation synchronous dynamic random-Access memory [1]. We present a simple noise-modeling method and signal-recovery algorithm with a noise range where our algorithm behaves reliably at error rate < 10-6. In addition, we propose an entire data acquisition system architecture that uses a Xilinx FPGA VCU118 board.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOf18th International System-on-Chip Design Conference, ISOCC 2021-
dc.relation.isPartOfProceedings - International SoC Design Conference 2021, ISOCC 2021-
dc.titleGiga-sample Data Acquisition Method for High-speed DDR5 SDRAM-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation18th International System-on-Chip Design Conference, ISOCC 2021, pp.109 - 110-
dc.identifier.wosid000861550500051-
dc.citation.conferenceDate2021-10-06-
dc.citation.conferencePlaceKO-
dc.citation.endPage110-
dc.citation.startPage109-
dc.citation.title18th International System-on-Chip Design Conference, ISOCC 2021-
dc.contributor.affiliatedAuthorKang, Seokhyeong-
dc.identifier.scopusid2-s2.0-85123380582-
dc.description.journalClass1-
dc.description.journalClass1-

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