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Cited 80 time in webofscience Cited 79 time in scopus
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dc.contributor.authorNam, S-
dc.contributor.authorJang, J-
dc.contributor.authorCha, H-
dc.contributor.authorHwang, J-
dc.contributor.authorAn, TK-
dc.contributor.authorPark, S-
dc.contributor.authorPark, CE-
dc.date.accessioned2015-06-25T02:26:37Z-
dc.date.available2015-06-25T02:26:37Z-
dc.date.created2012-05-30-
dc.date.issued2012-01-
dc.identifier.issn0959-9428-
dc.identifier.other2015-OAK-0000025556en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10969-
dc.description.abstractWe investigated the effects of direct solvent exposure on the properties of [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) films and poly(3-hexylthiophene) (P3HT)/PCBM blend films employed as active layers in, respectively, organic field-effect transistors (OFETs) and organic photovoltaics (OPVs). The crystallinity, morphology, and OFET characteristics of the PCBM thin films were significantly influenced by direct exposure to solvent, especially to select alcohols. Control over the nanoscale morphology of the PCBM film, achieved via direct solvent exposure, yielded highly efficient poly-(3-hexylthiophene) (P3HT)/PCBM OPVs with a short-circuit current density of 10.2 mA cm(-2), an open-circuit voltage of 0.64 V, and a power conversion efficiency of 3.25% under AM 1.5 illumination with a light intensity of 100 mW cm(-2). These results indicated that optimal phase separation in the P3HT/PCBM films could be obtained simply by exposing the active layer films for a few seconds to solvent.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherROYAL SOC CHEMISTRY-
dc.relation.isPartOfJOURNAL OF MATERIALS CHEMISTRY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleEffects of direct solvent exposure on the nanoscale morphologies and electrical characteristics of PCBM-based transistors and photovoltaics-
dc.typeArticle-
dc.contributor.college화학공학과en_US
dc.identifier.doi10.1039/C2JM15260F-
dc.author.googleNam, Sen_US
dc.author.googleJang, Jen_US
dc.author.googlePark, CEen_US
dc.author.googlePark, Sen_US
dc.author.googleAn, TKen_US
dc.author.googleHwang, Jen_US
dc.author.googleCha, Hen_US
dc.relation.volume22en_US
dc.relation.issue12en_US
dc.relation.startpage5543en_US
dc.relation.lastpage5549en_US
dc.contributor.id10104044en_US
dc.relation.journalJOURNAL OF MATERIALS CHEMISTRYen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS CHEMISTRY, v.22, no.12, pp.5543 - 5549-
dc.identifier.wosid000300838100040-
dc.date.tcdate2019-01-01-
dc.citation.endPage5549-
dc.citation.number12-
dc.citation.startPage5543-
dc.citation.titleJOURNAL OF MATERIALS CHEMISTRY-
dc.citation.volume22-
dc.contributor.affiliatedAuthorPark, CE-
dc.identifier.scopusid2-s2.0-84863251084-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc64-
dc.description.scptc62*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusTHIN-FILM TRANSISTORS-
dc.subject.keywordPlusPOLYMER SOLAR-CELLS-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordPlusPASSIVATION-
dc.subject.keywordPlusSTABILITY-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusNETWORK-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-

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박찬언PARK, CHAN EON
Dept. of Chemical Enginrg
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