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Cited 31 time in webofscience Cited 31 time in scopus
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dc.contributor.authorKim, JK-
dc.contributor.authorLuo, H-
dc.contributor.authorXi, YG-
dc.contributor.authorShah, JM-
dc.contributor.authorGessmann, T-
dc.contributor.authorSchubert, EF-
dc.date.accessioned2015-06-25T02:32:22Z-
dc.date.available2015-06-25T02:32:22Z-
dc.date.created2009-09-07-
dc.date.issued2006-01-
dc.identifier.issn0013-4651-
dc.identifier.other2015-OAK-0000018797en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/11156-
dc.description.abstractA theoretical and experimental analysis of light extraction in GaInN light-emitting diodes (LEDs) employing diffuse omnidirectional reflectors is presented. The diffuse omnidirectional reflector consists of GaN, a Ni/Au current spreading layer, a SiO2 layer roughened by Ar ion etching, and a Ag layer. Randomly distributed polystyrene spheres are used as an etch mask. The diffusely reflected power is enhanced by two orders of magnitude for a roughened reflector surface compared with a planar surface. The GaInN LEDs with diffuse omnidirectional reflectors show a higher light output (>3.3%) and a lower angular dependence of emission than LEDs with specular reflectors. The enhancement is attributed to reduced trapping of light within the high-index GaN semiconductor. (c) 2005 The Electrochemical Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherELECTROCHEMICAL SOC INC-
dc.relation.isPartOfJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleLight extraction in GaInN light-emitting diodes using diffuse omnidirectional reflectors-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1149/1.2137647-
dc.author.googleKim, JKen_US
dc.author.googleLuo, Hen_US
dc.author.googleSchubert, EFen_US
dc.author.googleGessmann, Ten_US
dc.author.googleShah, JMen_US
dc.author.googleXi, YGen_US
dc.relation.volume153en_US
dc.relation.issue2en_US
dc.relation.startpageG105en_US
dc.relation.lastpageG107en_US
dc.contributor.id10100864en_US
dc.relation.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.2, pp.G105 - G107-
dc.identifier.wosid000234543400056-
dc.date.tcdate2019-01-01-
dc.citation.endPageG107-
dc.citation.number2-
dc.citation.startPageG105-
dc.citation.titleJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.volume153-
dc.contributor.affiliatedAuthorKim, JK-
dc.identifier.scopusid2-s2.0-30644479719-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc24-
dc.description.scptc26*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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