DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kwon, YB | - |
dc.contributor.author | Je, JH | - |
dc.contributor.author | Ruterana, P | - |
dc.contributor.author | Nouet, G | - |
dc.date.accessioned | 2015-06-25T02:34:33Z | - |
dc.date.available | 2015-06-25T02:34:33Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2005-11 | - |
dc.identifier.issn | 0734-2101 | - |
dc.identifier.other | 2015-OAK-0000005523 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/11226 | - |
dc.description.abstract | The origin of threading dislocations (TDs) in GaN epitaxial layers grown on sapphire (0001) substrate is investigated using moire fringes from plan-view transmission electron microscopy. The studied samples are nucleation layers deposited at 560 degrees C for times ranging from 20 s to 180 s. This initial stage growth gives rise to islands which are randomly rotated and relaxed with misfit dislocations. The islands that start to coalesce from 60 s growth time keep this random orientation and this leads to the bending of 60 degrees misfit dislocations in the interface plane to form a-type TDs inside low angle boundaries. (c) 2005 American Vacuum Society. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | A V S AMER INST PHYSICS | - |
dc.relation.isPartOf | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | On the origin of a-type threading dislocations in GaN layers | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | en_US |
dc.identifier.doi | 10.1116/1.2049301 | - |
dc.author.google | Kwon, YB | en_US |
dc.author.google | Je, JH | en_US |
dc.author.google | Nouet, G | en_US |
dc.author.google | Ruterana, P | en_US |
dc.relation.volume | 23 | en_US |
dc.relation.issue | 6 | en_US |
dc.relation.startpage | 1588 | en_US |
dc.relation.lastpage | 1591 | en_US |
dc.contributor.id | 10123980 | en_US |
dc.relation.journal | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.23, no.6, pp.1588 - 1591 | - |
dc.identifier.wosid | 000233395800016 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 1591 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 1588 | - |
dc.citation.title | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | - |
dc.citation.volume | 23 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-31044433602 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 14 | - |
dc.description.scptc | 15 | * |
dc.date.scptcdate | 2018-10-274 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | LIGHT-EMITTING-DIODES | - |
dc.subject.keywordPlus | EPITAXIAL LAYERS | - |
dc.subject.keywordPlus | BLUE | - |
dc.subject.keywordPlus | SAPPHIRE | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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