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dc.contributor.authorLee, NY-
dc.contributor.authorYong, KJ-
dc.contributor.authorJeong, HS-
dc.contributor.authorKim, CM-
dc.date.accessioned2015-06-25T02:34:39Z-
dc.date.available2015-06-25T02:34:39Z-
dc.date.created2009-04-02-
dc.date.issued2005-07-
dc.identifier.issn0734-2101-
dc.identifier.other2015-OAK-0000005292en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/11229-
dc.description.abstractAdsorption and reactions of tetrabutoxysilane (Si(OC4H9)(4)) on a Si(100) surface were investigated using temperature programmed desorption and x-ray photoelectron spectroscopy. Physisorbed tetrabutoxysilane undergoes C-O bond scission to form -O-Si(OC4H9)(3) and butyl species on Si(100) at 200 K. It is observed that further C-O bond scission takes place sequentially in the temperature range of 200-500 K. Main desorption products are butene and hydrogen, which are desorbed at 410 K and 820 K, respectively. We propose that the production of butene takes place through beta-hydride elimination of the butyl group on Si(100). (c) 2005 American Vacuum Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherA V S AMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleAdsorption and reactions of tetrabutoxysilane (TBOS) on Si(100)-
dc.typeArticle-
dc.contributor.college화학공학과en_US
dc.identifier.doi10.1116/1.1927106-
dc.author.googleLee, NYen_US
dc.author.googleYong, KJen_US
dc.author.googleKim, CMen_US
dc.author.googleJeong, HSen_US
dc.relation.volume23en_US
dc.relation.issue4en_US
dc.relation.startpage613en_US
dc.relation.lastpage616en_US
dc.contributor.id10131864en_US
dc.relation.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY Aen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.23, no.4, pp.613 - 616-
dc.identifier.wosid000230717200008-
dc.date.tcdate2018-03-23-
dc.citation.endPage616-
dc.citation.number4-
dc.citation.startPage613-
dc.citation.titleJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.citation.volume23-
dc.contributor.affiliatedAuthorYong, KJ-
dc.identifier.scopusid2-s2.0-31044455324-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.scptc0*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusSILICON DIOXIDE-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusTETRAETHYLORTHOSILICATE-
dc.subject.keywordPlusSIO2-FILMS-
dc.subject.keywordPlusGROWTH-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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용기중YONG, KIJUNG
Dept. of Chemical Enginrg
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