Open Access System for Information Sharing

Login Library

 

Article
Cited 5 time in webofscience Cited 6 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
DC FieldValueLanguage
dc.contributor.authorJang, HW-
dc.contributor.authorLee, JL-
dc.date.accessioned2015-06-25T02:36:05Z-
dc.date.available2015-06-25T02:36:05Z-
dc.date.created2009-02-28-
dc.date.issued2005-11-
dc.identifier.issn1071-1023-
dc.identifier.other2015-OAK-0000005623en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/11276-
dc.description.abstractEnhancement of electroluminescence in GaN-based light-emitting diodes (LEDs) was achieved using an efficient current blocking layer formed by postannealing, When a LED chip with Ni/Au pad on Ni/Au transparent p contact was annealed at 500 degrees C, the electroluminescence of the LED chip increased by 55%. The specific contact resistivity of metal contact below the p pad significantly increased due to indiffusion of Au and Ni atoms from the p pad to the contact interfacial region. As a result, an efficient current blocking layer could be formed below the p pad, enhancing the light output and decreasing the reverse leakage current of the LED chip, This result suggests that a further increase in the extraction efficiency of GaN-based LEDs can be easily obtained using the postannealing. (c) 2005 American Vacuum Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherA V S AMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleEnhancement of electroluminescence in GaN-based light-emitting diodes using an efficient current blocking layer-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1116/1.2083931-
dc.author.googleJang, HWen_US
dc.author.googleLee, JLen_US
dc.relation.volume23en_US
dc.relation.issue6en_US
dc.relation.startpage2284en_US
dc.relation.lastpage2287en_US
dc.contributor.id10105416en_US
dc.relation.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY Ben_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.23, no.6, pp.2284 - 2287-
dc.identifier.wosid000234613200008-
dc.date.tcdate2019-01-01-
dc.citation.endPage2287-
dc.citation.number6-
dc.citation.startPage2284-
dc.citation.titleJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-
dc.citation.volume23-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-29044438114-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.description.scptc6*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusRESISTANCE OHMIC CONTACTS-
dc.subject.keywordPlusOXIDIZED NI/AU-
dc.subject.keywordPlusPLASMA-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse