Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography
SCIE
SCOPUS
- Title
- Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography
- Authors
- Lee, Keondo; Lee, Donghyeon; Park, Jaehyun; Lee, Jong-Lam; Chung, Wan Kyun; Cho, Yunje; Nam, Ki Hyun
- Date Issued
- 2022-09
- Publisher
- MDPI
- Abstract
- © 2022 by the authors.Featured Application: Recently upgraded inject-and-transfer system will improve beamtime efficiency for serial femtosecond crystallography. Serial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystals to the XFEL beam path in a serial manner. We recently developed a sample delivery method, the combined inject-and-transfer system (BITS), which is a hybrid method based on the injector and fixed-target scanning approach. In this study, we introduced recently upgraded hardware to move the injection needle in the direction of the XYZ-axis and a graphic user interface for user motion control. Furthermore, we report that the viscous solution containing 10% (w/v) PEG 3350 or PEG 6000 that is widely used for protein crystallization can be stably deposited on polyimide film with a hydrophobic surface without any special treatment. Moreover, the development of an inject-and-diffuse method for time-resolved studies with liquid applications in the BITS and its preliminary results are reported. This study provides up-to-date instrument information to SFX users using BITS and provides insights to instrument developers for SFX.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/114872
- DOI
- 10.3390/app12189125
- ISSN
- 2076-3417
- Article Type
- Article
- Citation
- Applied Sciences-basel, vol. 12, no. 18, 2022-09
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- There are no files associated with this item.
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