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dc.contributor.authorKam, Dongyun-
dc.contributor.authorMin, Jung Gyu-
dc.contributor.authorYoon, Jongho-
dc.contributor.authorKim, Sunmean-
dc.contributor.authorKang, Seokhyeong-
dc.contributor.authorLee, Youngjoo-
dc.date.accessioned2023-03-02T04:21:55Z-
dc.date.available2023-03-02T04:21:55Z-
dc.date.created2023-03-02-
dc.date.issued2022-03-15-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/116153-
dc.description.abstractIn this paper, we introduce the design and veri-fication frameworks for developing a fully-functional emerging ternary processor. Based on the existing compiling environments for binary processors, for the given ternary instructions, the software-level framework provides an efficient way to convert the given programs to the ternary assembly codes. We also present a hardware-level framework to rapidly evaluate the performance of a ternary processor implemented in arbitrary design technology. As a case study, the fully-functional 9-trit advanced RISC-based ternary (ART-9) core is newly developed by using the proposed frameworks. Utilizing 24 custom ternary instructions, the 5-stage ART-9 prototype architecture is successfully verified by a number of test programs including dhrystone benchmark in a ternary domain, achieving the processing efficiency of 57.8 DMIPS/W and 3.06times 10^{6} DMIPS/W in the FPGA-level ternary-logic emulations and the emerging CNTFET ternary gates, respectively.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOf2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022-
dc.relation.isPartOfProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022-
dc.titleDesign and Evaluation Frameworks for Advanced RISC-based Ternary Processor-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, pp.1077 - 1082-
dc.citation.conferenceDate2022-03-14-
dc.citation.conferencePlaceBE-
dc.citation.endPage1082-
dc.citation.startPage1077-
dc.citation.title2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022-
dc.contributor.affiliatedAuthorKang, Seokhyeong-
dc.contributor.affiliatedAuthorLee, Youngjoo-
dc.description.journalClass1-
dc.description.journalClass1-

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이영주LEE, YOUNGJOO
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