DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kam, Dongyun | - |
dc.contributor.author | Min, Jung Gyu | - |
dc.contributor.author | Yoon, Jongho | - |
dc.contributor.author | Kim, Sunmean | - |
dc.contributor.author | Kang, Seokhyeong | - |
dc.contributor.author | Lee, Youngjoo | - |
dc.date.accessioned | 2023-03-02T04:21:55Z | - |
dc.date.available | 2023-03-02T04:21:55Z | - |
dc.date.created | 2023-03-02 | - |
dc.date.issued | 2022-03-15 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/116153 | - |
dc.description.abstract | In this paper, we introduce the design and veri-fication frameworks for developing a fully-functional emerging ternary processor. Based on the existing compiling environments for binary processors, for the given ternary instructions, the software-level framework provides an efficient way to convert the given programs to the ternary assembly codes. We also present a hardware-level framework to rapidly evaluate the performance of a ternary processor implemented in arbitrary design technology. As a case study, the fully-functional 9-trit advanced RISC-based ternary (ART-9) core is newly developed by using the proposed frameworks. Utilizing 24 custom ternary instructions, the 5-stage ART-9 prototype architecture is successfully verified by a number of test programs including dhrystone benchmark in a ternary domain, achieving the processing efficiency of 57.8 DMIPS/W and 3.06times 10^{6} DMIPS/W in the FPGA-level ternary-logic emulations and the emerging CNTFET ternary gates, respectively. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.relation.isPartOf | 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 | - |
dc.relation.isPartOf | Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 | - |
dc.title | Design and Evaluation Frameworks for Advanced RISC-based Ternary Processor | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, pp.1077 - 1082 | - |
dc.citation.conferenceDate | 2022-03-14 | - |
dc.citation.conferencePlace | BE | - |
dc.citation.endPage | 1082 | - |
dc.citation.startPage | 1077 | - |
dc.citation.title | 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 | - |
dc.contributor.affiliatedAuthor | Kang, Seokhyeong | - |
dc.contributor.affiliatedAuthor | Lee, Youngjoo | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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