Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | BYUN, YOUNGHOON | - |
| dc.contributor.author | LEE, YOUNGJOO | - |
| dc.date.accessioned | 2023-03-03T00:53:38Z | - |
| dc.date.available | 2023-03-03T00:53:38Z | - |
| dc.date.created | 2023-03-02 | - |
| dc.date.issued | 2022-01-25 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/116448 | - |
| dc.publisher | 한국반도체학술대회 사무국 | - |
| dc.relation.isPartOf | 제 29회 한국반도체학술대회 | - |
| dc.title | 64bit RISC-V 기반 칩 검증 플랫폼 설계 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 제 29회 한국반도체학술대회 | - |
| dc.citation.conferenceDate | 2022-01-24 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 제 29회 한국반도체학술대회 | - |
| dc.contributor.affiliatedAuthor | BYUN, YOUNGHOON | - |
| dc.contributor.affiliatedAuthor | LEE, YOUNGJOO | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 이영주LEE, YOUNGJOO
- Dept of Electrical Enginrg