Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs
- Title
- Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs
- Authors
- BAEK, ROCK HYUN; 정진수; 이상욱; 이승환; 이준종; 임재완
- Date Issued
- 2023-09-08
- Publisher
- 2023 SSDM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/119824
- Article Type
- Conference
- Citation
- 2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08
- Files in This Item:
- There are no files associated with this item.
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