DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhang, Chao | - |
dc.contributor.author | Jeon, Hoyeon | - |
dc.contributor.author | Oh, Myungchul | - |
dc.contributor.author | Lee, Minjun | - |
dc.contributor.author | Kim, Sungmin | - |
dc.contributor.author | Yi, Sunwouk | - |
dc.contributor.author | Lee, Hanho | - |
dc.contributor.author | Zoh, Inhae | - |
dc.contributor.author | Yoo, Yongchan | - |
dc.contributor.author | Kuk, Young | - |
dc.date.accessioned | 2024-03-04T02:40:20Z | - |
dc.date.available | 2024-03-04T02:40:20Z | - |
dc.date.created | 2024-03-02 | - |
dc.date.issued | 2017-06 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/120658 | - |
dc.description.abstract | <jats:p>A wideband cryogenic amplifier has been developed for low temperature scanning tunneling microscopy. The amplifier consisting of a wideband complementary metal oxide semiconductor field effect transistors operational amplifier together with a feedback resistor of 100 kΩ and a capacitor is mounted within a 4 K Dewar. This amplifier has a wide bandwidth and is successfully applied to scanning tunneling microscopy applications at low temperatures down to ∼7 K. The quality of the designed amplifier is validated by high resolution imaging. More importantly, the amplifier has also proved to be capable of performing scanning tunneling spectroscopy measurements, showing the detection of the Shockley surface state of the Au(111) surface and the superconducting gap of Nb(110).</jats:p> | - |
dc.language | English | - |
dc.publisher | American Institute of Physics | - |
dc.relation.isPartOf | Review of Scientific Instruments | - |
dc.title | Note: Development of a wideband amplifier for cryogenic scanning tunneling microscopy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.4990041 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Review of Scientific Instruments, v.88, no.6 | - |
dc.identifier.wosid | 000404641300069 | - |
dc.citation.number | 6 | - |
dc.citation.title | Review of Scientific Instruments | - |
dc.citation.volume | 88 | - |
dc.contributor.affiliatedAuthor | Oh, Myungchul | - |
dc.identifier.scopusid | 2-s2.0-85021702375 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Review | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
library@postech.ac.kr Tel: 054-279-2548
Copyrights © by 2017 Pohang University of Science ad Technology All right reserved.