Open Access System for Information Sharing

Login Library

 

Article
Cited 2 time in webofscience Cited 2 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
There are no files associated with this item.
DC FieldValueLanguage
dc.contributor.authorZhang, Chao-
dc.contributor.authorJeon, Hoyeon-
dc.contributor.authorOh, Myungchul-
dc.contributor.authorLee, Minjun-
dc.contributor.authorKim, Sungmin-
dc.contributor.authorYi, Sunwouk-
dc.contributor.authorLee, Hanho-
dc.contributor.authorZoh, Inhae-
dc.contributor.authorYoo, Yongchan-
dc.contributor.authorKuk, Young-
dc.date.accessioned2024-03-04T02:40:20Z-
dc.date.available2024-03-04T02:40:20Z-
dc.date.created2024-03-02-
dc.date.issued2017-06-
dc.identifier.issn0034-6748-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/120658-
dc.description.abstract<jats:p>A wideband cryogenic amplifier has been developed for low temperature scanning tunneling microscopy. The amplifier consisting of a wideband complementary metal oxide semiconductor field effect transistors operational amplifier together with a feedback resistor of 100 kΩ and a capacitor is mounted within a 4 K Dewar. This amplifier has a wide bandwidth and is successfully applied to scanning tunneling microscopy applications at low temperatures down to ∼7 K. The quality of the designed amplifier is validated by high resolution imaging. More importantly, the amplifier has also proved to be capable of performing scanning tunneling spectroscopy measurements, showing the detection of the Shockley surface state of the Au(111) surface and the superconducting gap of Nb(110).</jats:p>-
dc.languageEnglish-
dc.publisherAmerican Institute of Physics-
dc.relation.isPartOfReview of Scientific Instruments-
dc.titleNote: Development of a wideband amplifier for cryogenic scanning tunneling microscopy-
dc.typeArticle-
dc.identifier.doi10.1063/1.4990041-
dc.type.rimsART-
dc.identifier.bibliographicCitationReview of Scientific Instruments, v.88, no.6-
dc.identifier.wosid000404641300069-
dc.citation.number6-
dc.citation.titleReview of Scientific Instruments-
dc.citation.volume88-
dc.contributor.affiliatedAuthorOh, Myungchul-
dc.identifier.scopusid2-s2.0-85021702375-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.type.docTypeReview-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

오명철OH, MYUNGCHUL
Department of Semiconductor Engineering
Read more

Views & Downloads

Browse