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멀티모달 트랜스포머 구조를 통한 공정 이력 데이터 기반 최종 품질 예측 방법
- Title
- 멀티모달 트랜스포머 구조를 통한 공정 이력 데이터 기반 최종 품질 예측 방법
- Authors
- CHOI, SEUNGHYUN; KIM, KWANG JAE
- Date Issued
- 2023-06-01
- Publisher
- 대한산업공학회
- Article Type
- Conference
- Citation
- 2023 Spring Conference of Korean Institute of Industrial Engineers, 2023-06-01
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.