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dc.contributor.authorJANGSEOP, LEE-
dc.contributor.authorSEO, YOORI-
dc.contributor.author반상현-
dc.contributor.authorKIM, DONGMIN-
dc.contributor.authorSEONGJAE, HEO-
dc.contributor.authorKANG, DAEHWAN-
dc.contributor.authorHwang, Hyunsang-
dc.date.accessioned2024-03-05T09:03:54Z-
dc.date.available2024-03-05T09:03:54Z-
dc.date.created2024-03-04-
dc.date.issued2023-12-12-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/121005-
dc.description.abstractWe investigate the effect of material design and UV treatment on nanoscale (d = 50 nm) ovonic threshold switch (OTS) devices for selector-only memory (SOM) applications. By characterizing OTS devices with varying material compositions, we identified selenium (Se) as a key element for SOM operation. The optimized OTS device exhibited a large memory window (MW > 1.2 V) with an ultra-fast write operation speed (~ 10 ns). Additionally, we demonstrate that interface engineering with proper UV treatment significantly improved device variability characteristics. UV-treated OTS devices demonstrated excellent retention (> 10 years at RT) and cycling endurance properties (> 10-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOf2023 International Electron Devices Meeting, IEDM 2023-
dc.relation.isPartOfTechnical Digest - International Electron Devices Meeting, IEDM-
dc.titleEnhancing Se-based Selector-only Memory with Ultra-fast Write Speed (~ 10 ns) and Superior Retention Characteristics (> 10 years at RT) via Material Design and UV Treatment Engineering-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2023 International Electron Devices Meeting, IEDM 2023-
dc.citation.conferenceDate2023-12-09-
dc.citation.conferencePlaceUS-
dc.citation.title2023 International Electron Devices Meeting, IEDM 2023-
dc.contributor.affiliatedAuthorJANGSEOP, LEE-
dc.contributor.affiliatedAuthorSEO, YOORI-
dc.contributor.affiliatedAuthor반상현-
dc.contributor.affiliatedAuthorKIM, DONGMIN-
dc.contributor.affiliatedAuthorSEONGJAE, HEO-
dc.contributor.affiliatedAuthorKANG, DAEHWAN-
dc.contributor.affiliatedAuthorHwang, Hyunsang-
dc.description.journalClass1-
dc.description.journalClass1-

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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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