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dc.contributor.authorKANG, SEOKHYEONG-
dc.contributor.authorChoi, Youngchang-
dc.contributor.authorChoi, Minjeong-
dc.contributor.authorLee, Kyongsu-
dc.date.accessioned2024-03-06T07:02:53Z-
dc.date.available2024-03-06T07:02:53Z-
dc.date.created2024-03-04-
dc.date.issued2023-04-17-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/122056-
dc.description.abstractAnalog circuit design requires significant human efforts and expertise; therefore, electronic design automation (EDA) tools for analog design are needed. This study presents MA-Opt that is an analog circuit optimizer using reinforcement learning (RL)-inspired framework. MA-Opt using multiple actors is proposed to provide various predictions of optimized circuit designs in parallel. Sharing a specific memory that affects the loss function of network training is proposed to exploit multiple actors effectively, accelerating circuit optimization. Moreover, we devise a novel method to tune the most optimized design in previous simulations into a more optimized design. To demonstrate the efficiency of the proposed framework, MA-Opt was simulated for three analog circuits and the results were compared with those of other methods. The experimental results indicated the strength of using multiple actors with a shared elite solution set and the near-sampling method. Within the same number of simulations, while satisfying all given constraints, MA-Opt obtained minimum target metrics up to 24% better than DNN-Opt. Furthermore, MA-Opt obtained better Figure of Merits (FoMs) than DNN-Opt at the same runtime.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOf2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023-
dc.relation.isPartOfProceedings -Design, Automation and Test in Europe, DATE-
dc.titleMA-Opt: Reinforcement Learning-based Analog Circuit Optimization using Multi-Actors-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023-
dc.citation.conferenceDate2023-04-17-
dc.citation.conferencePlaceBE-
dc.citation.title2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023-
dc.contributor.affiliatedAuthorKANG, SEOKHYEONG-
dc.description.journalClass1-
dc.description.journalClass1-

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