HIER: Metric Learning Beyond Class Labels via Hierarchical Regularization
- Title
- HIER: Metric Learning Beyond Class Labels via Hierarchical Regularization
- Authors
- 곽수하; 김성연; 정보승
- Date Issued
- 2023-06
- Publisher
- IEEE Computer Society
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/122810
- Article Type
- Conference
- Citation
- 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, 2023-06
- Files in This Item:
- There are no files associated with this item.
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