Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
SCIE
SCOPUS
- Title
- Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
- Authors
- KIM, YOUNG YONG; Khubbutdinov, Ruslan; Carnis, Jérôme; Kim, Sangsoo; Nam, Daewoong; Nam, Inhyuk; Kim, Gyujin; Shim, Chi Hyun; Yang, Haeryong; Cho, Myunghoon; Min, Chang Ki; Kim Changbum; Kang, HeungSik; Vartanyants, Ivan A.
- Date Issued
- 2022-11
- Publisher
- Blackwell Publishing Inc.
- Abstract
- A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70-80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/122955
- DOI
- 10.1107/S1600577522008773
- ISSN
- 0909-0495
- Article Type
- Article
- Citation
- Journal of Synchrotron Radiation, vol. 29, no. 6, page. 1465 - 1479, 2022-11
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- There are no files associated with this item.
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