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Cited 12 time in webofscience Cited 12 time in scopus
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dc.contributor.authorJhi, SH-
dc.contributor.authorLouie, SG-
dc.contributor.authorCohen, ML-
dc.date.accessioned2015-06-25T03:15:21Z-
dc.date.available2015-06-25T03:15:21Z-
dc.date.created2009-03-14-
dc.date.issued2005-11-25-
dc.identifier.issn0031-9007-
dc.identifier.other2015-OAK-0000005528en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/12432-
dc.description.abstractThe electronic structures of carbon nanotubes doped with oxygen dimers are studied using the ab initio pseudopotential density functional method. The fundamental energy gap of zigzag semiconducting nanotubes exhibits a strong dependence on both the concentration and configuration of oxygen-dimer defects that substitute for carbon atoms in the tubes and on the tube chiral index. For a certain type of zigzag nanotube when doped with oxygen dimers, the energy gap is closed and the tube becomes semimetallic. At higher oxygen-dimer concentrations the gap reopens, and the tube exhibits semiconducting behavior again. The change of the band gap of the zigzag tube is understood in terms of their response to the strains caused by the dimer substitutional doping.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMERICAN PHYSICAL SOC-
dc.relation.isPartOfPHYSICAL REVIEW LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleReentrant semiconducting behavior of zigzag carbon nanotubes at substitutional doping by oxygen dimers-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1103/PhysRevLett.95.226403-
dc.author.googleJhi, SHen_US
dc.author.googleLouie, SGen_US
dc.author.googleCohen, MLen_US
dc.relation.volume95en_US
dc.relation.issue22en_US
dc.relation.startpage226403en_US
dc.contributor.id10136707en_US
dc.relation.journalPHYSICAL REVIEW LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationPHYSICAL REVIEW LETTERS, v.95, no.22, pp.226403-
dc.identifier.wosid000233458500052-
dc.date.tcdate2019-01-01-
dc.citation.number22-
dc.citation.startPage226403-
dc.citation.titlePHYSICAL REVIEW LETTERS-
dc.citation.volume95-
dc.contributor.affiliatedAuthorJhi, SH-
dc.identifier.scopusid2-s2.0-28844436729-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc11-
dc.type.docTypeArticle-
dc.subject.keywordPlusDEFECT-INDUCED OXIDATION-
dc.subject.keywordPlusELECTRONIC-PROPERTIES-
dc.subject.keywordPlusRADIAL DEFORMATION-
dc.subject.keywordPlusGRAPHITE-
dc.subject.keywordPlusFULLERENE-
dc.subject.keywordPlusSENSORS-
dc.subject.keywordPlusBEAM-
dc.subject.keywordPlusC-60-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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