DC Field | Value | Language |
---|---|---|
dc.contributor.author | Xu, R | - |
dc.contributor.author | Salha, S | - |
dc.contributor.author | Raines, KS | - |
dc.contributor.author | Jiang, HD | - |
dc.contributor.author | Chen, CC | - |
dc.contributor.author | Takahashi, Y | - |
dc.contributor.author | Kohmura, Y | - |
dc.contributor.author | Nishino, Y | - |
dc.contributor.author | Song, CY | - |
dc.contributor.author | Ishikawa, T | - |
dc.contributor.author | Miao, JW | - |
dc.date.accessioned | 2015-07-30T19:01:52Z | - |
dc.date.available | 2015-07-30T19:01:52Z | - |
dc.date.created | 2015-07-09 | - |
dc.date.issued | 2011-03 | - |
dc.identifier.issn | 0909-0495 | - |
dc.identifier.other | 2015-OAK-0000033402 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/13275 | - |
dc.description.abstract | Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | WILEY-BLACKWELL | - |
dc.relation.isPartOf | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.subject | coherent diffraction microscopy | - |
dc.subject | coherent diffraction imaging | - |
dc.subject | lensless imaging | - |
dc.subject | oversampling | - |
dc.subject | phase retrieval | - |
dc.subject | X-RAY-DIFFRACTION | - |
dc.subject | PHASE RETRIEVAL | - |
dc.subject | RESOLUTION | - |
dc.subject | CELLS | - |
dc.subject | WHOLE | - |
dc.title | Coherent diffraction microscopy at SPring-8: instrumentation, data acquisition and data analysis | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | en_US |
dc.identifier.doi | 10.1107/S0909049510051733 | - |
dc.author.google | Xu, R | en_US |
dc.author.google | Salha, S | en_US |
dc.author.google | Raines, KS | en_US |
dc.author.google | Jiang, HD | en_US |
dc.author.google | Chen, CC | en_US |
dc.author.google | Takahashi, Y | en_US |
dc.author.google | Kohmura, Y | en_US |
dc.author.google | Nishino, Y | en_US |
dc.author.google | Song, CY | en_US |
dc.author.google | Ishikawa, T | en_US |
dc.author.google | Miao, JW | en_US |
dc.relation.volume | 18 | en_US |
dc.relation.issue | 2 | en_US |
dc.relation.startpage | 293 | en_US |
dc.relation.lastpage | 298 | en_US |
dc.contributor.id | 10084037 | en_US |
dc.relation.journal | JOURNAL OF SYNCHROTRON RADIATION | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF SYNCHROTRON RADIATION, v.18, no.2, pp.293 - 298 | - |
dc.identifier.wosid | 000287530900026 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 298 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 293 | - |
dc.citation.title | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.citation.volume | 18 | - |
dc.contributor.affiliatedAuthor | Song, CY | - |
dc.identifier.scopusid | 2-s2.0-79951936906 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 13 | - |
dc.description.scptc | 13 | * |
dc.date.scptcdate | 2018-10-274 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | X-RAY | - |
dc.subject.keywordPlus | PHASE RETRIEVAL | - |
dc.subject.keywordPlus | WHOLE | - |
dc.subject.keywordAuthor | coherent diffraction microscopy | - |
dc.subject.keywordAuthor | coherent diffraction imaging | - |
dc.subject.keywordAuthor | lensless imaging | - |
dc.subject.keywordAuthor | oversampling | - |
dc.subject.keywordAuthor | phase retrieval | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
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