DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang Y.S | - |
dc.contributor.author | Bae J.G | - |
dc.contributor.author | Park C.G. | - |
dc.date.accessioned | 2016-01-08T14:54:04Z | - |
dc.date.available | 2016-01-08T14:54:04Z | - |
dc.date.created | 2009-06-29 | - |
dc.date.issued | 2008-01 | - |
dc.identifier.issn | 1742-6588 | - |
dc.identifier.other | 2008-OAK-0000011786 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/13500 | - |
dc.description.abstract | Residual stress in the axial direction of the steel wires has been measured by using a method based on the combination of the focused ion beam (FIB) milling and digital image correlation software. That is, the residual stress was calculated from the measured displacement field before and after the introduction of a slot along the steel wires. The displacement was obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot was introduced by FIB milling with low energy beam. The fitting of the experimental results to an analytical model with the independent Young's modulus determined allows us to find the residual stress. The complete experimental procedures are described and its feasibilities are also evaluated for the thin-sized steel wires. | - |
dc.description.statementofresponsibility | open | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.relation.isPartOf | JOURNAL OF PHYSICS: CONFERENCE SERIES | - |
dc.title | Measurement of residual stress by using focused ion beam and digital image correlation method in thin-sized wires used for steel cords | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1088/1742-6596/1 | - |
dc.author.google | Yang Y.S., Bae J.G., Park C.G. | - |
dc.relation.volume | 100 | - |
dc.relation.issue | 1 | - |
dc.relation.startpage | 12018 | - |
dc.relation.lastpage | 12018 | - |
dc.contributor.id | 10069857 | - |
dc.relation.journal | JOURNAL OF PHYSICS: CONFERENCE SERIES | - |
dc.relation.sci | SCIE | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF PHYSICS: CONFERENCE SERIES, v.100, no.1, pp.12018 - 12018 | - |
dc.identifier.wosid | 000275655200018 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 12018 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 12018 | - |
dc.citation.title | JOURNAL OF PHYSICS: CONFERENCE SERIES | - |
dc.citation.volume | 100 | - |
dc.contributor.affiliatedAuthor | Park C.G. | - |
dc.identifier.scopusid | 2-s2.0-44649121596 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 2 | - |
dc.type.docType | Proceedings Paper | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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