DC Field | Value | Language |
---|---|---|
dc.contributor.author | Aslam, M | - |
dc.contributor.author | Rao, GS | - |
dc.contributor.author | Khan, N | - |
dc.contributor.author | Jun, CH | - |
dc.date.accessioned | 2016-03-31T07:54:22Z | - |
dc.date.available | 2016-03-31T07:54:22Z | - |
dc.date.created | 2015-02-04 | - |
dc.date.issued | 2014-05 | - |
dc.identifier.issn | 0090-3973 | - |
dc.identifier.other | 2015-OAK-0000031029 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/14139 | - |
dc.description.abstract | The purpose of this paper is to design an SkSP-V acceptance sampling plan for assuring percentiles based on a time-truncated life test as the reference plan when the lifetime of a product follows an exponentiated Weibull distribution. Using the non-linear optimization solution, the plan parameters are determined so as to satisfy the producer's and the consumer's risks. Tables are provided for practical use and an example is shown with a real case. Finally, the results are compared with the single sampling plan in terms of the average sample number to demonstrate the efficiency of the proposed plan. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | AMER SOC TESTING MATERIALS | - |
dc.relation.isPartOf | JOURNAL OF TESTING AND EVALUATION | - |
dc.subject | exponentiated Weibull distribution | - |
dc.subject | acceptance sampling | - |
dc.subject | risks | - |
dc.subject | percentile life | - |
dc.subject | BIRNBAUM-SAUNDERS DISTRIBUTION | - |
dc.subject | FAMILY | - |
dc.subject | INSPECTION | - |
dc.title | SkSP-V Sampling Plan for the Exponentiated Weibull Distribution | - |
dc.type | Article | - |
dc.contributor.college | 산업경영공학과 | - |
dc.identifier.doi | 10.1520/JTE20130051 | - |
dc.author.google | Aslam, M | - |
dc.author.google | Rao, GS | - |
dc.author.google | Khan, N | - |
dc.author.google | Jun, CH | - |
dc.relation.volume | 42 | - |
dc.relation.issue | 3 | - |
dc.contributor.id | 10070938 | - |
dc.relation.journal | JOURNAL OF TESTING AND EVALUATION | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF TESTING AND EVALUATION, v.42, no.3, pp.687 - 694 | - |
dc.identifier.wosid | 000345643800015 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 694 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 687 | - |
dc.citation.title | JOURNAL OF TESTING AND EVALUATION | - |
dc.citation.volume | 42 | - |
dc.contributor.affiliatedAuthor | Jun, CH | - |
dc.identifier.scopusid | 2-s2.0-84924283679 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 1 | - |
dc.description.scptc | 1 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | exponentiated Weibull distribution | - |
dc.subject.keywordAuthor | acceptance sampling | - |
dc.subject.keywordAuthor | risks | - |
dc.subject.keywordAuthor | percentile life | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Characterization & Testing | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
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