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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Aslam, M | - |
| dc.contributor.author | Azam, M | - |
| dc.contributor.author | Lio, YL | - |
| dc.contributor.author | Jun, CH | - |
| dc.date.accessioned | 2016-03-31T08:16:59Z | - |
| dc.date.available | 2016-03-31T08:16:59Z | - |
| dc.date.created | 2014-02-25 | - |
| dc.date.issued | 2013-07 | - |
| dc.identifier.issn | 0090-3973 | - |
| dc.identifier.other | 2013-OAK-0000028955 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/14961 | - |
| dc.description.abstract | A two-stage group acceptance sampling plan for the percentile of lifetimes which have the Burr type X distribution is discussed under the time truncated life test. The sampling plan parameters for the two-stage sampling plan are determined such that the producer's risk and consumer's risk are satisfied simultaneously for the given tester size and experiment time. The advantage of the proposed two-stage sampling plan over the single-stage sampling plan is also discussed. Useful tables are given for practical purpose. | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | AMER SOC TESTING MATERIALS | - |
| dc.relation.isPartOf | JOURNAL OF TESTING AND EVALUATION | - |
| dc.subject | group acceptance sampling | - |
| dc.subject | Burr type X distribution | - |
| dc.subject | producer and consumer risks | - |
| dc.subject | life test | - |
| dc.subject | TRUNCATED LIFE TESTS | - |
| dc.subject | GENERALIZED RAYLEIGH DISTRIBUTION | - |
| dc.subject | BIRNBAUM-SAUNDERS DISTRIBUTION | - |
| dc.subject | MODEL | - |
| dc.subject | RELIABILITY | - |
| dc.subject | PREDICTION | - |
| dc.title | Two-Stage Group Acceptance Sampling Plan for Burr Type X Percentiles | - |
| dc.type | Article | - |
| dc.contributor.college | 산업경영공학과 | - |
| dc.identifier.doi | 10.1520/JTE20120209 | - |
| dc.author.google | Aslam, M | - |
| dc.author.google | Azam, M | - |
| dc.author.google | Lio, YL | - |
| dc.author.google | Jun, CH | - |
| dc.relation.volume | 41 | - |
| dc.relation.issue | 4 | - |
| dc.relation.startpage | 525 | - |
| dc.relation.lastpage | 533 | - |
| dc.contributor.id | 10070938 | - |
| dc.relation.journal | JOURNAL OF TESTING AND EVALUATION | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCIE | - |
| dc.collections.name | Journal Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | JOURNAL OF TESTING AND EVALUATION, v.41, no.4, pp.525 - 533 | - |
| dc.identifier.wosid | 000321725300001 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.endPage | 533 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 525 | - |
| dc.citation.title | JOURNAL OF TESTING AND EVALUATION | - |
| dc.citation.volume | 41 | - |
| dc.contributor.affiliatedAuthor | Jun, CH | - |
| dc.identifier.scopusid | 2-s2.0-84883014286 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 4 | - |
| dc.description.scptc | 6 | * |
| dc.date.scptcdate | 2018-05-121 | * |
| dc.type.docType | Article | - |
| dc.subject.keywordAuthor | group acceptance sampling | - |
| dc.subject.keywordAuthor | Burr type X distribution | - |
| dc.subject.keywordAuthor | producer and consumer risks | - |
| dc.subject.keywordAuthor | life test | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Characterization & Testing | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Materials Science | - |
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- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg