DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gil Ho Gu | - |
dc.contributor.author | Dong Hyun Jang | - |
dc.contributor.author | Ki Bum Nam | - |
dc.contributor.author | Park, CG | - |
dc.date.accessioned | 2016-03-31T08:17:47Z | - |
dc.date.available | 2016-03-31T08:17:47Z | - |
dc.date.created | 2014-02-25 | - |
dc.date.issued | 2013-08 | - |
dc.identifier.issn | 1431-9276 | - |
dc.identifier.other | 2013-OAK-0000028911 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/14990 | - |
dc.description.abstract | In this paper, we have observed an atomic-scale structure and compositional variation at the interface of the InGaN/GaN multi-quantum wells (MQW) by both scanning transmission electron microscopy (STEM) using high-angle annular dark-field mode and atom probe tomography (APT). The iso-concentration analysis of APT results revealed that the roughness of InGaN/GaN interface increased as the MQW layers were filled up, and that the upper interface of MQW (GaN/InGaN to the p-GaN side) was much rougher than that of the lower interface (InGaN/GaN tot he n-GaN side). On the basis of experimental results, it is suggested that the formation of interface roughness can affect the quantum efficiency of InGaN-based light-emitting diodes. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | Microscopy and Microanalysis | - |
dc.relation.isPartOf | Microscopy and Microanalysis | - |
dc.subject | composition fluctuation of In | - |
dc.subject | well-width fluctuation | - |
dc.subject | atom probe | - |
dc.subject | STEM | - |
dc.subject | InGaN | - |
dc.subject | LED | - |
dc.subject | MOLECULAR-BEAM | - |
dc.subject | SEGREGATION | - |
dc.subject | INDIUM | - |
dc.subject | PHOTOLUMINESCENCE | - |
dc.subject | IMPACT | - |
dc.title | Composition Fluctuation of In and Well-Width Fluctuation in InGaN/GaN Multiple Quantum Wells in Light-Emitting Diode Devices | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1017/S1431927613012427 | - |
dc.author.google | Gu G.H., Jang D.H., Nam K.B., Park C.G. | - |
dc.relation.volume | 19 | - |
dc.relation.startpage | 99 | - |
dc.relation.lastpage | 104 | - |
dc.contributor.id | 10069857 | - |
dc.relation.journal | Microscopy and Microanalysis | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Microscopy and Microanalysis, v.19, pp.99 - 104 | - |
dc.identifier.wosid | 000332111100023 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 104 | - |
dc.citation.startPage | 99 | - |
dc.citation.title | Microscopy and Microanalysis | - |
dc.citation.volume | 19 | - |
dc.contributor.affiliatedAuthor | Park, CG | - |
dc.identifier.scopusid | 2-s2.0-84881448000 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 13 | - |
dc.description.scptc | 10 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | MOLECULAR-BEAM | - |
dc.subject.keywordPlus | SEGREGATION | - |
dc.subject.keywordPlus | INDIUM | - |
dc.subject.keywordPlus | PHOTOLUMINESCENCE | - |
dc.subject.keywordPlus | IMPACT | - |
dc.subject.keywordAuthor | composition fluctuation of In | - |
dc.subject.keywordAuthor | well-width fluctuation | - |
dc.subject.keywordAuthor | atom probe | - |
dc.subject.keywordAuthor | STEM | - |
dc.subject.keywordAuthor | InGaN | - |
dc.subject.keywordAuthor | LED | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Microscopy | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Microscopy | - |
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