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Cited 10 time in webofscience Cited 8 time in scopus
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dc.contributor.authorLee, D-
dc.contributor.authorLee, K-
dc.contributor.authorJeong, S-
dc.contributor.authorLee, J-
dc.contributor.authorChoi, B-
dc.contributor.authorLee, J-
dc.contributor.authorKim, O-
dc.date.accessioned2016-03-31T08:36:53Z-
dc.date.available2016-03-31T08:36:53Z-
dc.date.created2013-03-07-
dc.date.issued2012-06-
dc.identifier.issn0021-4922-
dc.identifier.other2012-OAK-0000027312-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/15660-
dc.description.abstractLow-pressure chemical vapor deposition (LPCVD) is a simple and useful method for the large-area synthesis of graphene films. Here, we have investigated how to adjust and optimize process conditions for the synthesis of single-layer graphene films by LPCVD. Through our experimental procedure, uniform and high-quality graphene films could be grown on Cu foil at 1000 degrees C for 20 min with an H-2 flow rate of 20 sccm, CH4 flow rate of 40 sccm, total pressure of 1.7 Torr, and a fast cooling rate (>10 degrees C/s). In a Raman spectrum measured from synthesized graphene film, we found that the full width at half-maximum (FWHM) of a symmetric 2D peak centered at 2682.5 cm(-1) was 34 cm(-1) and the 2D-to-G intensity ratio was 1.35. (C) 2012 The Japan Society of Applied Physics-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.relation.isPartOfJapanese Journal of Applied Physics-
dc.titleProcess optimization for synthesis of high-quality graphene films by low-pressure chemical vapor deposition-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1143/JJAP.51.06FD21-
dc.author.googleLee, D-
dc.author.googleLee, K-
dc.author.googleJeong, S-
dc.author.googleLee, J-
dc.author.googleChoi, B-
dc.author.googleKim, O-
dc.relation.volume51-
dc.relation.issue6-
dc.relation.startpage06FD21-
dc.contributor.id10087230-
dc.relation.journalJapaness Journal of Applied Physics-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJapanese Journal of Applied Physics, v.51, no.6, pp.6FD21-1 - 6FD21-4-
dc.identifier.wosid000306189800040-
dc.date.tcdate2019-01-01-
dc.citation.endPage6FD21-4-
dc.citation.number6-
dc.citation.startPage6FD21-1-
dc.citation.titleJapanese Journal of Applied Physics-
dc.citation.volume51-
dc.contributor.affiliatedAuthorLee, J-
dc.contributor.affiliatedAuthorKim, O-
dc.identifier.scopusid2-s2.0-84863308751-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc9-
dc.description.scptc1*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusFEW-LAYER GRAPHENE-
dc.subject.keywordPlusBILAYER GRAPHENE-
dc.subject.keywordPlusELECTRONIC-PROPERTIES-
dc.subject.keywordPlusRAMAN-SPECTROSCOPY-
dc.subject.keywordPlusCARBON-
dc.subject.keywordPlusTRANSISTORS-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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