Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography

Abstract

A 3-dimensional Fddd network structure of a polystyrene-block-polyisoprene (PS-b-PI) diblock copolymer (M(n) = 31 500, f(PI) = 0.645) was observed for the first time in real space by transmission electron microtomography (TEMT). In a 650 nm thick film of the PS-b-PI thin film on a silicon wafer, the Fddd phase was developed after annealing at 215 degrees C for 24 h. The single network structure consists of the connected tripodal units of minor PS block domains. The {111}(Fddd) plane, the densest plane of the minor PS phase, was found to orient parallel to the film plane. The transitional structure from the wetting layer at the free surface to the internal {111}(Fddd) plane via a perforated layer structure was also observed.