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0.3-nm SASE-FEL at PAL SCIE SCOPUS

Title
0.3-nm SASE-FEL at PAL
Authors
Oh, JSKim, DEKim, ESPark, SJKang, HSLee, TYKoo, TYChang, SSChung, CWNam, SHNamkung, W
Date Issued
2004-08-01
Publisher
ELSEVIER SCIENCE BV
Abstract
Recent success in SASE-FEL experiments provides high confidence in achieving FEL radiation wavelengths as short as 0.1 nm. The SASE-XFEL requires multi-GeV electron beams with extremely low-emittance, short bunches, and long undulator systems. PAL is operating a 2.5-GeV electron linac as a full-energy injector to the PLS storage ring. With a proposed energy upgrade to 3.0 GeV and an in-vacuum undulator, PAL will be able to produce coherent X-ray radiation at wavelengths as short as 0.3 nm. This paper presents the preliminary design details for the proposed PAL-XFEL. The required undulator period is 12.5 mm with a 3-mm gap. The third harmonic enhancement technique can be used to obtain radiation wavelengths of 0.1 nm. The technical parameters related to these goals are reviewed. (C) 2004 Elsevier B.V. All rights reserved.
Keywords
PAL; X-ray SASE; in-vacuum undulator; 0.3 nm; third-harmonic enhancement
URI
https://oasis.postech.ac.kr/handle/2014.oak/17749
DOI
10.1016/J.NIMA.2004.
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 528, no. 1-2, page. 582 - 585, 2004-08-01
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