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Cited 22 time in webofscience Cited 22 time in scopus
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dc.contributor.authorKim, JK-
dc.contributor.authorJang, HW-
dc.contributor.authorLee, JL-
dc.date.accessioned2016-03-31T12:43:09Z-
dc.date.available2016-03-31T12:43:09Z-
dc.date.created2009-02-28-
dc.date.issued2003-12-01-
dc.identifier.issn0021-8979-
dc.identifier.other2003-OAK-0000003825-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/18245-
dc.description.abstractElectrical properties of Pt/AlxGa1-xN Schottky diodes and chemical bonding states of AlxGa1-xN surface were examined simultaneously to investigate the change in the current transport mechanisms of the Pt/AlxGa1-xN diodes with increasing Al mole fraction. The Pt/GaN diodes showed electrical properties given by the thermionic-emission theory, while the Pt/Al0.35Ga0.65N showed a nonideal Schottky behavior. The oxygen donors were predominantly incorporated at the surface of AlxGa1-xN with increasing Al mole fraction, causing the surface to be heavily doped n type. Consequently, the current transport in the Pt/Al0.35Ga0.65N diodes was dominated by the field emission of electrons through the Schottky barrier, leading to the nonideal Schottky behavior. (C) 2003 American Institute of Physics.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF APPLIED PHYSICS-
dc.titleCurrent conduction mechanism of Pt/GaN and Pt/Al0.35Ga0.65N Schottky diodes-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1063/1.1625101-
dc.author.googleKim, JK-
dc.author.googleJang, HW-
dc.author.googleLee, JL-
dc.relation.volume94-
dc.relation.issue11-
dc.relation.startpage7201-
dc.relation.lastpage7205-
dc.contributor.id10105416-
dc.relation.journalJOURNAL OF APPLIED PHYSICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.94, no.11, pp.7201 - 7205-
dc.identifier.wosid000186492600030-
dc.date.tcdate2019-01-01-
dc.citation.endPage7205-
dc.citation.number11-
dc.citation.startPage7201-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume94-
dc.contributor.affiliatedAuthorKim, JK-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-0346962327-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc16-
dc.description.scptc15*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusGAN-
dc.subject.keywordPlusPHOTODETECTORS-
dc.subject.keywordPlusALXGA1-XN-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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