Microstructure of RE2O3 layers on cube textured Ni substrates
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SCOPUS
- Title
- Microstructure of RE2O3 layers on cube textured Ni substrates
- Authors
- Je, JH; You, H; Cullen, WG; Maroni, VA; Ma, B; Koritala, RE; Rupich, MW; Thieme, CLH
- Date Issued
- 2003-01-15
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- We investigated the structure and alignment of epitaxial Y2O3 and Gd2O3 films on cube textured Ni(001) substrates and used the findings to develop a general interpretation of the morphology of RE,03 films (RE = Y or a rare earth element) on cube textured nickel and nickel-based alloys. The [10 0] axis of RE2O3 oxides mostly prefers aligning to the Ni[0 0 1] axis, while the [0 0 1] axis is aligned with the Ni[0 0 1] axis. This (2root2 x 2root2)R45degrees extended domain matching (EDM) seems to be favored by a high coincidence site density (CSD) with the Ni(0 0 1) surface atoms, in spite of the existence of large lattice mismatches to Ni(0 0 1). Meanwhile a 3 x 3 EDM is not favored on Ni(O 0 1), in spite of the relatively small lattice mismatch to Ni(O 0 1), because of the existence of a low CSD. The broad mosaic distributions of RE2O3(0 0 1) grains (6-9degrees full-width at half-maximum) indicate that RE,03 layers prefer growing along the Ni(O 0 1) planes rather than along the Ni surface, a condition presumably induced by the favorable energetics for EDM. (C) 2002 Elsevier Science B.V. All rights reserved.
- Keywords
- RE2O3/Ni; coincidence site density; extended domain matching; cube textured Ni substrates; CRITICAL-CURRENT DENSITY; YBCO COATED CONDUCTORS; SUPERCONDUCTING TAPES; BUFFER LAYERS; FILMS; EVAPORATION; DEPOSITION; GROWTH
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/18745
- DOI
- 10.1016/S0921-4534(02)01982-2
- ISSN
- 0921-4534
- Article Type
- Article
- Citation
- PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, vol. 384, no. 1-2, page. 54 - 60, 2003-01-15
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