DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SS | - |
dc.contributor.author | Il Kim, B | - |
dc.contributor.author | Park, YB | - |
dc.contributor.author | Kang, TS | - |
dc.contributor.author | Je, JH | - |
dc.date.accessioned | 2016-03-31T13:22:03Z | - |
dc.date.available | 2016-03-31T13:22:03Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2001-01-15 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.other | 2001-OAK-0000001814 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/19666 | - |
dc.description.abstract | The structural characteristics of LaNiO3/Si(0 0 1) films grown by pulsed laser deposition have been studied mainly using a synchrotron X-ray scattering measurement. The films were grown with the (0 0 1) preferred orientation without any alignment in the in-plane direction. The initially unstrained film became strained gradually as it grew further, but its crystalline quality improved significantly. A fully (0 0 1) textured Pb(Zr0.4Ti0.6)O-3 film was successfully grown on such a (0 0 I) textured LaNiO3/Si(0 0 1) substrate as low as 350 degreesC. The nature of structure and microstructure of the Pb(Zr0.4Ti0.6)O-3 film appeared to be similar to that of the underlaying LaNiO3 film. (C) 2001 Elsevier Science B.V. All rights reserved. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.relation.isPartOf | APPLIED SURFACE SCIENCE | - |
dc.subject | LaNiO3 thin film | - |
dc.subject | PZT thin film | - |
dc.subject | ferroelectric thin film | - |
dc.subject | pulsed laser deposition | - |
dc.subject | synchrotron X-ray scattering | - |
dc.subject | LANIO3 | - |
dc.title | Growth of a textured Pb(Zr0.4Ti0.6)O-3 thin film on LaNiO3/Si(001) using pulsed laser deposition | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1016/S0169-4332(00)00736-4 | - |
dc.author.google | Kim, SS | - |
dc.author.google | Il Kim, B | - |
dc.author.google | Park, YB | - |
dc.author.google | Kang, TS | - |
dc.author.google | Je, JH | - |
dc.relation.volume | 169 | - |
dc.relation.startpage | 553 | - |
dc.relation.lastpage | 556 | - |
dc.contributor.id | 10123980 | - |
dc.relation.journal | APPLIED SURFACE SCIENCE | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Conference Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.169, pp.553 - 556 | - |
dc.identifier.wosid | 000167087700115 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 556 | - |
dc.citation.startPage | 553 | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 169 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-0035127117 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 13 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | LaNiO3 thin film | - |
dc.subject.keywordAuthor | PZT thin film | - |
dc.subject.keywordAuthor | ferroelectric thin film | - |
dc.subject.keywordAuthor | pulsed laser deposition | - |
dc.subject.keywordAuthor | synchrotron X-ray scattering | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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