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Cited 12 time in webofscience Cited 12 time in scopus
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dc.contributor.authorKim, S-
dc.contributor.authorPark, Y-
dc.contributor.authorKang, Y-
dc.contributor.authorPark, W-
dc.contributor.authorBaik, S-
dc.contributor.authorGruverman, AL-
dc.date.accessioned2016-03-31T13:53:37Z-
dc.date.available2016-03-31T13:53:37Z-
dc.date.created2009-08-11-
dc.date.issued1998-01-14-
dc.identifier.issn0040-6090-
dc.identifier.other1998-OAK-0000000210-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/20780-
dc.description.abstractEpitaxial PbTiO3 and BaTiO3 thin films were pl spared on MgO(100) by laser ablation and RF magnetron sputter deposition, respectively. X-ray diffraction (XRD), transmission electron microscopy (TEM), and atomic force microscopy (AFM) were used to investigate the ferroelectric domains in the grown films. in the PbTiO3 film, significant portions of a-domains were distributed in c-domains, which causes abundant 90 degrees domain population, On the other hand, the BaTiO3 film was mainly single c-domains without any meaningful domain structure. We attribute the difference in domain population of the two films to two reasons. One is the smaller phase transformation strain which comes from smaller tetragonality of BaTiO3, and the other is the larger compressive stress due to thermal mismatch which comes from lower T-c, of BaTiO3 than those of PbTiO3. (C) 1998 Elsevier Science S.A.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.relation.isPartOfTHIN SOLID FILMS-
dc.subjectferroelectric thin films-
dc.subjectlaser ablation-
dc.subjectsputtering-
dc.subjectferroelectric domain-
dc.subjectsputtering-
dc.subjectMISFIT RELAXATION MECHANISMS-
dc.subjectSTRAIN RELAXATION-
dc.subjectCONFIGURATIONS-
dc.subjectDEPOSITION-
dc.subjectMGO-
dc.titleFerroelectric domains in epitaxial PbTiO3 and BaTiO3 thin films on MgO(100)-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1016/S0040-6090(97)00270-8-
dc.author.googleKim, S-
dc.author.googlePark, Y-
dc.author.googleKang, Y-
dc.author.googlePark, W-
dc.author.googleBaik, S-
dc.author.googleGruverman, AL-
dc.relation.volume312-
dc.relation.issue1-2-
dc.relation.startpage249-
dc.relation.lastpage253-
dc.contributor.id10078291-
dc.relation.journalTHIN SOLID FILMS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.312, no.1-2, pp.249 - 253-
dc.identifier.wosid000073635500041-
dc.date.tcdate2019-01-01-
dc.citation.endPage253-
dc.citation.number1-2-
dc.citation.startPage249-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume312-
dc.contributor.affiliatedAuthorBaik, S-
dc.identifier.scopusid2-s2.0-0031651699-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc12-
dc.type.docTypeArticle-
dc.subject.keywordPlusMISFIT RELAXATION MECHANISMS-
dc.subject.keywordPlusSTRAIN RELAXATION-
dc.subject.keywordPlusCONFIGURATIONS-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusMGO-
dc.subject.keywordAuthorferroelectric thin films-
dc.subject.keywordAuthorlaser ablation-
dc.subject.keywordAuthorsputtering-
dc.subject.keywordAuthorferroelectric domain-
dc.subject.keywordAuthorsputtering-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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