CHARACTERIZATION AND X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION OF PBO-BI2O3-GA2O3 GLASSES
SCIE
SCOPUS
- Title
- CHARACTERIZATION AND X-RAY PHOTOELECTRON-SPECTROSCOPY INVESTIGATION OF PBO-BI2O3-GA2O3 GLASSES
- Authors
- HEO, J; KIM, CG; KIM, YS
- Date Issued
- 1995-05
- Publisher
- AMER CERAMIC SOC 735 CERAMIC PLACE
- Abstract
- XPS O1s spectra were recorded for glasses in the binary PbO-Ga2O3 and ternary PbO-Bi2O3-Ga2O3 systems. Large shoulders with chemical shifts of 1.4 to 1.9 eV were observed in the O1s spectra recorded from PbO-Ga2O3 glasses. These shoulders were attributed to the presence of nonbridging oxygens in the structure. The shoulders indicated that, contrary to previous results, PbO was a network modifier as well as a charge compensator and network former. The addition of Bi2O3 reduced the number of nonbridging oxygens and, therefore, it was classified as an intermediate. Ga2O3 seemed to form GaO4- tetrahedra, constituting the backbone of the network structure. Glasses in the PbO-Bi2O3-Ga2O3 system had their IR cutoff edges located at 7 mu m with glass transition temperatures in the range of 320 degrees to 400 degrees C.
- Keywords
- METAL OXIDE GLASSES; CRYSTALS; SPECTRA
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/21789
- DOI
- 10.1111/j.1151-2916.1995.tb08483.x
- ISSN
- 0002-7820
- Article Type
- Article
- Citation
- JOURNAL OF THE AMERICAN CERAMIC SOCIETY, vol. 78, no. 5, page. 1285 - 1290, 1995-05
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