DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SY | - |
dc.contributor.author | Lee, JL | - |
dc.date.accessioned | 2016-04-01T01:11:01Z | - |
dc.date.available | 2016-04-01T01:11:01Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2008-10 | - |
dc.identifier.issn | 1566-1199 | - |
dc.identifier.other | 2008-OAK-0000008116 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/22519 | - |
dc.description.abstract | We determined the interface dipole energies between interfacial layers with different thicknesses coated on indium tin oxides (ITOs) and tris(8-hydroxyquinoline) aluminum using ultraviolet and synchrotron radiation photoemission spectroscopy. After O-2 plasma treatment on 20-nm thick metal coated ITO, the work function and interface dipole energy increased. In 2-nm thick metal coated ITO, no change in the interface dipole energy was found though the work function increased. According to the valence band spectra, 2-nm thick metals are fully oxidized, but 20-nm thick metals are partially oxidized after O-2 plasma treatment. Therefore, it is considered that the contribution of the surface dipole by the deposition of Alq(3) on 2-nm thick metal is lower, resulting in a lower interface dipole. Thus, the thickness of interfacial layer has a great impact on the formation of interface dipole. (C) 2008 Elsevier B.V. All rights reserved. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.relation.isPartOf | ORGANIC ELECTRONICS | - |
dc.subject | interface dipole | - |
dc.subject | Alq(3) synchrotron radiation photoemission spectroscopy | - |
dc.subject | work function | - |
dc.subject | organic light emitting diodes | - |
dc.subject | ENERGY-LEVEL ALIGNMENT | - |
dc.subject | PHOTOEMISSION-SPECTROSCOPY | - |
dc.subject | ORGANIC/METAL INTERFACES | - |
dc.subject | CONJUGATED POLYMERS | - |
dc.subject | METAL | - |
dc.subject | FILMS | - |
dc.subject | SEMICONDUCTORS | - |
dc.subject | PENTACENE | - |
dc.subject | DEVICES | - |
dc.subject | OXIDE | - |
dc.title | Effect of interfacial layer thickness on the formation of interface dipole in metal/tris(8-hydroxyquinoline) aluminum interface | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1016/j.orgel.2008.04.010 | - |
dc.author.google | Kim, SY | - |
dc.author.google | Lee, JL | - |
dc.relation.volume | 9 | - |
dc.relation.issue | 5 | - |
dc.relation.startpage | 678 | - |
dc.relation.lastpage | 686 | - |
dc.contributor.id | 10105416 | - |
dc.relation.journal | ORGANIC ELECTRONICS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | ORGANIC ELECTRONICS, v.9, no.5, pp.678 - 686 | - |
dc.identifier.wosid | 000259133500018 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 686 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 678 | - |
dc.citation.title | ORGANIC ELECTRONICS | - |
dc.citation.volume | 9 | - |
dc.contributor.affiliatedAuthor | Lee, JL | - |
dc.identifier.scopusid | 2-s2.0-49049097077 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 12 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ENERGY-LEVEL ALIGNMENT | - |
dc.subject.keywordPlus | PHOTOEMISSION-SPECTROSCOPY | - |
dc.subject.keywordPlus | ORGANIC/METAL INTERFACES | - |
dc.subject.keywordPlus | CONJUGATED POLYMERS | - |
dc.subject.keywordPlus | METAL | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | SEMICONDUCTORS | - |
dc.subject.keywordPlus | PENTACENE | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordAuthor | interface dipole | - |
dc.subject.keywordAuthor | Alq(3) synchrotron radiation photoemission spectroscopy | - |
dc.subject.keywordAuthor | work function | - |
dc.subject.keywordAuthor | organic light emitting diodes | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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