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dc.contributor.authorKyung Tae Do-
dc.contributor.authorKim, YH-
dc.contributor.authorSon, HS-
dc.date.accessioned2016-04-01T01:44:31Z-
dc.date.available2016-04-01T01:44:31Z-
dc.date.created2010-07-20-
dc.date.issued2007-02-
dc.identifier.issn0167-9260-
dc.identifier.other2007-OAK-0000006541-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/23601-
dc.description.abstractWe present a new timing model for latch-controlled sub-systems, referred to as the advanced black box model. The proposed model considers the transparency characteristics of latches in modeling and uses only the constraints on input signals and the characteristics of output departure time to represent the timing characteristics of the latch-controlled sub-system. Thus, it can be used for the efficient timing verification of the IP-bascd SoC design without re-verifying the internal timings of pre-verified Intellectual Properties (IPs) at the lower level. We also present an efficient algorithm to characterize the proposed model, which enables us to perform the timing characterization and verification of the given system simultaneously. The worst-case complexity of the entire characterization process is O(P x N-2), where P and N are the numbers of primary inputs and latches in the system. (c) 2006 Elsevier B.V. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.relation.isPartOfINTEGRATION-THE VLSI JOURNAL-
dc.subjecttiming model-
dc.subjecttiming verification-
dc.subjectintellectual property-
dc.subjectlatch-controlled system-
dc.subjectSoC-
dc.subjectMOS VLSI-
dc.titleTiming modeling of latch-controlled sub-systems-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1016/J.VLSI.2006.-
dc.author.googleDo, KT-
dc.author.googleKim, YH-
dc.author.googleSon, HS-
dc.relation.volume40-
dc.relation.issue2-
dc.relation.startpage62-
dc.relation.lastpage73-
dc.contributor.id10176127-
dc.relation.journalINTEGRATION-THE VLSI JOURNAL-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationINTEGRATION-THE VLSI JOURNAL, v.40, no.2, pp.62 - 73-
dc.identifier.wosid000243627000002-
dc.date.tcdate2019-01-01-
dc.citation.endPage73-
dc.citation.number2-
dc.citation.startPage62-
dc.citation.titleINTEGRATION-THE VLSI JOURNAL-
dc.citation.volume40-
dc.contributor.affiliatedAuthorKim, YH-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc4-
dc.type.docTypeArticle-
dc.subject.keywordAuthortiming model-
dc.subject.keywordAuthortiming verification-
dc.subject.keywordAuthorintellectual property-
dc.subject.keywordAuthorlatch-controlled system-
dc.subject.keywordAuthorSoC-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-

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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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