DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, JH | - |
dc.contributor.author | Kim, DH | - |
dc.contributor.author | Jang, Y | - |
dc.contributor.author | Lee, WH | - |
dc.contributor.author | Ihm, K | - |
dc.contributor.author | Han, JH | - |
dc.contributor.author | Chung, S | - |
dc.contributor.author | Cho, K | - |
dc.date.accessioned | 2016-04-01T01:49:55Z | - |
dc.date.available | 2016-04-01T01:49:55Z | - |
dc.date.created | 2009-03-19 | - |
dc.date.issued | 2006-09-25 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.other | 2006-OAK-0000006256 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/23800 | - |
dc.description.abstract | To investigate the effects of metal penetration into organic semiconductors on the electrical properties of organic thin film transistors, gold was deposited onto pentacene films at various deposition rates. The sharp interface between the gold electrode and the pentacene film that results from a fast deposition rate was found to produce lower contact resistance and an increase in the field-effect mobility. (c) 2006 American Institute of Physics. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.title | Effects of metal penetration into organic semiconductors on the electrical properties of organic thin film transistors | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | - |
dc.identifier.doi | 10.1063/1.2357155 | - |
dc.author.google | Cho, JH | - |
dc.author.google | Kim, DH | - |
dc.author.google | Jang, Y | - |
dc.author.google | Lee, WH | - |
dc.author.google | Ihm, K | - |
dc.author.google | Han, JH | - |
dc.author.google | Chung, S | - |
dc.author.google | Cho, K | - |
dc.relation.volume | 89 | - |
dc.relation.issue | 13 | - |
dc.contributor.id | 10071841 | - |
dc.relation.journal | APPLIED PHYSICS LETTERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.89, no.13 | - |
dc.identifier.wosid | 000240875800058 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 13 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 89 | - |
dc.contributor.affiliatedAuthor | Chung, S | - |
dc.contributor.affiliatedAuthor | Cho, K | - |
dc.identifier.scopusid | 2-s2.0-33749247216 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 66 | - |
dc.description.scptc | 73 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | CONTACT RESISTANCE | - |
dc.subject.keywordPlus | PENTACENE | - |
dc.subject.keywordPlus | INTERDIFFUSION | - |
dc.subject.keywordPlus | INTERFACES | - |
dc.subject.keywordPlus | MORPHOLOGY | - |
dc.subject.keywordPlus | AU | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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