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dc.contributor.authorWeon, BM-
dc.contributor.authorJe, JH-
dc.contributor.authorHwu, Y-
dc.contributor.authorMargaritondo, G-
dc.date.accessioned2016-04-01T01:51:25Z-
dc.date.available2016-04-01T01:51:25Z-
dc.date.created2009-02-28-
dc.date.issued2006-06-
dc.identifier.issn1475-7435-
dc.identifier.other2006-OAK-0000006170-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/23857-
dc.description.abstractIn the last decade X-ray imaging based on phase contrast greatly advanced thanks to the use of unmonochromatic synchrotron hard X-rays. The recent advances are going beyond microradiology and microtomography to reach nanometre scale. This paper reviews basic theory and selected applications to biomedical and materials sciences. The forthcoming improvements in phase contrast X-ray imaging will lead to even better imaging of many different phenomena at nanometre level.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherINDERSCIENCE ENTERPRISES LTD-
dc.relation.isPartOfINTERNATIONAL JOURNAL OF NANOTECHNOLOGY-
dc.subjectX-ray imaging-
dc.subjectphase contrast-
dc.subjecthard X-ray-
dc.subjectunmonochromatic beam-
dc.subjectmicroradiology-
dc.subjectmicrotomography-
dc.subjectnanoradiology-
dc.subjectLOCALIZED ELECTROCHEMICAL DEPOSITION-
dc.subjectENHANCED SYNCHROTRON RADIOLOGY-
dc.subjectCOMPUTED-TOMOGRAPHY-
dc.subjectDIFFRACTION-
dc.subjectRADIATION-
dc.subjectMICRORADIOGRAPHY-
dc.subjectMICROTOMOGRAPHY-
dc.subjectINTERFEROMETER-
dc.subjectNANOPARTICLES-
dc.subjectMAMMOGRAPHY-
dc.titlePHASE CONTRAST X-RAY IMAGING-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1504/IJNT.2006.009584-
dc.author.googleWeon, BM-
dc.author.googleJe, JH-
dc.author.googleHwu, Y-
dc.author.googleMargaritondo, G-
dc.relation.volume3-
dc.relation.issue2-3-
dc.relation.startpage280-
dc.relation.lastpage297-
dc.contributor.id10123980-
dc.relation.journalINTERNATIONAL JOURNAL OF NANOTECHNOLOGY-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationINTERNATIONAL JOURNAL OF NANOTECHNOLOGY, v.3, no.2-3, pp.280 - 297-
dc.identifier.wosid000239892500008-
dc.date.tcdate2019-01-01-
dc.citation.endPage297-
dc.citation.number2-3-
dc.citation.startPage280-
dc.citation.titleINTERNATIONAL JOURNAL OF NANOTECHNOLOGY-
dc.citation.volume3-
dc.contributor.affiliatedAuthorJe, JH-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc25-
dc.type.docTypeArticle-
dc.subject.keywordPlusENHANCED SYNCHROTRON RADIOLOGY-
dc.subject.keywordPlusCOMPUTED-TOMOGRAPHY-
dc.subject.keywordPlusMICROTOMOGRAPHY-
dc.subject.keywordPlusREFRACTION-
dc.subject.keywordPlusRADIATION-
dc.subject.keywordPlusINDEX-
dc.subject.keywordAuthorX-ray imaging-
dc.subject.keywordAuthorphase contrast-
dc.subject.keywordAuthorhard X-ray-
dc.subject.keywordAuthorunmonochromatic beam-
dc.subject.keywordAuthormicroradiology-
dc.subject.keywordAuthormicrotomography-
dc.subject.keywordAuthornanoradiology-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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